Bar Inspection System -- Bar Inspection System (BIS)
from Olympus IMS
from Olympus IMS
The BIS can combine phased array (PA) and eddy current array (ECA) technologies to inspect the full volume and the full surface of round and square bars. The system is based on a unique "Floating Head" concept (PA) and on a "Wear Shoes" concept (ECA) for a constant optimal positioning of probes;... [See More]
- Instrument Technology: Eddy Current / Electromagnetic; Ultrasonic
- Flaw Detection / Inspection Area: Machining / Grinding Damage
- Instrument Type: Flaw Detectors
- Form Factor: Monitoring System
Similar parts from Olympus IMS
(Show More »)
Circograph® CP 6.412 -- 1485032
from Foerster Instruments, Inc.
from Foerster Instruments, Inc.
Processor-controlled unit, interface with PC, internal library [See More]
- Instrument Technology: Eddy Current / Electromagnetic
- Flaw Detection / Inspection Area: Machining / Grinding Damage; Surface Cracks / Abrasion
- Instrument Type: Flaw Detectors
- Form Factor: Bench / Rack / Cabinet; Monitoring System
Similar parts from Foerster Instruments, Inc.
(Show More »)
