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  • M542: Electrical Characterizations of Packages for use with GaAs MMIC Amplifiers
    A test methodology will be presented which combines the advantage of on-wafer RF probing with a TRL calibration to create a completely de-embeddable, novel "test fixture" capable of electrically characterizing most any style package or device. This scheme has been used to characterize many
  • Remote Control - Insight Into Remote Conditioning
    Automotive and electrical components that need be thermal-cycled come in many shapes and sizes, as do test chambers. But one size definitely does not fit all. Just try to force your half-buck fixture into your 8ft3 chamber or explain to management why a walk-in chamber is being used to test four

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