Metal / Metalloid Elemental Analyzers

10 Results
Inclusion identification and quantification analysis -- PoDFA
from ABB Measurement & Analytics

The PoDFA technique consists of filtering, under controlled conditions, a predetermined quantity of liquid aluminum through a very fine porosity filter disc. Inclusions of the melt are concentrated at the filter surface by a factor of 10,000. Developed by Alcan and commercialized by ABB, PoDFA is a... [See More]

  • Elements Analyzed: Metal / Metalloid
  • Analysis Method / Detection Technology: The PoDFA Technique
  • Sample Form: Liquid / Slurry Samples
Liquid metal cleanliness analyzer -- LiMCA CM
from ABB Measurement & Analytics

The LiMCA system provides granulometric and total density information on the inclusion content of aluminum melts, in real time, based on an objective and user-independent method. It is ideally suited for applications in process development, process control, and quality assurance. The size... [See More]

  • Elements Analyzed: Metal / Metalloid
  • Sample Form: Solid Samples
Mobile liquid aluminium cleanliness analyzer -- LiMCA III
from ABB Measurement & Analytics

The LiMCA system provides granulometric and total density information on the inclusion content of aluminum melts, in real time, based on an objective and user-independent method. It is ideally suited for applications in process development, process control, and quality assurance. The size... [See More]

  • Elements Analyzed: Metal / Metalloid
  • Sample Form: Solid Samples
Pressure filtration melt cleanliness analyzer -- Prefil Footprinter
from ABB Measurement & Analytics

Prefil ® is the only inclusion analyzer that provides an immediate result and, at the same time, a sample for further metallographic analysis. These two qualities make the Prefil ®-Footprinter a powerful solution for performing process control on a day-to-day basis, and/or on a more in-depth... [See More]

  • Elements Analyzed: Metal / Metalloid
  • Sample Form: Liquid / Slurry Samples
Benchtop XRF Analyzer for RoHS -- EA1000AIII
from Hitachi High-Tech America

Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement of hazardous substances you can ensure you will be... [See More]

  • Elements Analyzed: Metal / Metalloid; Element Range : Al - U
  • Sample Form: Solid Samples; Liquid / Slurry Samples
  • Test Media / Material Analyzed: Ferrous Metal (Steel, Cast Iron); Nonferrous (Copper, Aluminum); Inorganic Material
  • Analysis Method / Detection Technology: Si Semiconductor Detector
Benchtop XRF Analyzer for RoHS -- EA1400
from Hitachi High-Tech America

The new EA1400 benchtop XRF analyzer has speed, accuracy and versatility at its core. With an ultra-sensitive SDD detector, large sample chamber and optimized X-ray detector arrangement, it can be used for a range of applications and is ideal for RoHS regulatory screening. Rapid RoHS analysis. The... [See More]

  • Elements Analyzed: Metal / Metalloid; Al (13) to U (92), (Na(11) to U(92) when using Vacuum option)
  • Sample Form: Solid Samples
  • Test Media / Material Analyzed: Ferrous Metal (Steel, Cast Iron); Nonferrous (Copper, Aluminum); Inorganic Material
  • Analysis Method / Detection Technology: SDD Detector With Ultra-High Sensitivity
Handheld LIBS Metal Identification Analyzer -- Vulcan Series
from Hitachi High-Tech America

Vulcan is one of the fastest metals analyzers that is built to last. Just squeeze the trigger and one second later the result appears. As it uses Laser Induced Breakdown (LIBS) technology, you won ’t need to worry about X-rays. Whether your business is scrap sorting or PMI quality control... [See More]

  • Elements Analyzed: Metal / Metalloid
  • Sample Form: Solid Samples
  • Test Media / Material Analyzed: Ferrous Metal (Steel, Cast Iron); Nonferrous (Copper, Aluminum); Inorganic Material
  • Analysis Method / Detection Technology: Laser Induced Breakdown (LIBS) Technology
Mobile Spectrometer for Metal Analysis -- PMI-Master Pro2
from Hitachi High-Tech America

The PMI-MASTER range of optical emission spectrometers (OES) for mobile metal analysis. The mobile spectrometers PMI-MASTER are used for the precise analysis of key elements, rapid material verification, positive materials identification (PMI) and sorting of different metals. They are ideally suited... [See More]

  • Elements Analyzed: Carbon (C); Nitrogen (N) / Protein; Sulfur (S); Phosphorus (P); Metal / Metalloid; B, Sn, As
  • Sample Form: Solid Samples
  • Test Media / Material Analyzed: Ferrous Metal (Steel, Cast Iron); Inorganic Material
  • Analysis Method / Detection Technology: Spectrometric Detection
Optical Emission Spectrometers -- FOUNDRY-MASTER Smart
from Hitachi High-Tech America

Compact size, high performance. Seamless quality control is essential in the metals industry at multiple stages of production. The FOUNDRY-MASTER Smart and Optimum are the ideal solution for the metal production and processing industry, providing cost-effective, reliable analysis. These new... [See More]

  • Elements Analyzed: Nitrogen (N) / Protein; Metal / Metalloid; Fe, Al, Cu, Ni, Co, Mg, Ti, Zn
  • Sample Form: Solid Samples
  • Test Media / Material Analyzed: Ferrous Metal (Steel, Cast Iron); Nonferrous (Copper, Aluminum); Inorganic Material
  • Analysis Method / Detection Technology: Spectrometric Detection
Spark Spectrometer Metal Analyzer -- OE750 / OE720
from Hitachi High-Tech America

The OE750 and the NEW OE720 are ground-breaking OES metals analyzers. They cover the complete spectrum of elements in metal* with low detection limits and state-of-the-art multi-CMOS technology. Tightening of industry regulations, complex supply chains and increased use of scrap as a base material... [See More]

  • Elements Analyzed: Metal / Metalloid; Trace Elements
  • Sample Form: Solid Samples
  • Test Media / Material Analyzed: Ferrous Metal (Steel, Cast Iron); Nonferrous (Copper, Aluminum); Inorganic Material
  • Analysis Method / Detection Technology: Spectrometric Detection; Semiconductor Detectors and Patent Pending Optical Concept Technology