Products & Services
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Supplier: CHINO Works America Inc.
Description: The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment /analytical processing and also has tester function as well as temperature accelerating testing.
- Components / Products Tested: Active Components / Semiconductors, Boards - Loaded PCB, MEMS / Sensors, Optoelectronics / Fiber Optics, Passive Components, Power Supplies / Transformers
- DUT Interfacing / Adapters: Flying Prober / Scanner
- Features: Burn-in, Fault Diagnostics / Logic Analysis, Temperature Controller
- Options / Module Types: Measure Unit / Monitor, Source Module / Unit, Interface / Fixture System
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Supplier: Hamamatsu Photonics
Description: on semiconductor manufacturing equipment. Allows multichannel measurement in real time, which provides simultaneous multichannel measurement and multipoint measurement on film surfaces. At the same time it can also measure reflectivity (transmittance), object
- Gaging Technology: Optical
- Range: 7.87E-7 to 0.0039 inch
- Units: Metric
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Supplier: Hamamatsu Photonics
Description: The Optical NanoGauge Thickness measurement system C12562 is a compact, space-saving, non-contact film thickness measurement system designed to easily install in equipment where needed. In the semiconductor industry, measuring silicon thickness is essential due to the
- Gaging Technology: Optical
- Range: 1.97E-5 to 0.0118 inch
- Units: Metric
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Description: IEC 60204-33:2009 applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors. It is applicable to the electrical equipment or parts of the
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Supplier: Fischer Technology, Inc.
Description: With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to
- Form Factor: Bench / Rack / Cabinet
- Instrument Type: Material Condition
- Technology: Radiographic / X-ray
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Supplier: Fischer Technology, Inc.
Description: With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, Aperture and detector – make it possible to
- Form Factor: Bench / Rack / Cabinet
- Instrument Type: Material Condition
- Technology: Radiographic / X-ray
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Supplier: CSA Group
Description: IEC 60204-33:2009 applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors. It is applicable to the electrical equipment or parts of the
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Supplier: Fischer Technology, Inc.
Description: makes them ideal for very demanding measurement tasks. Using XDV devices you can, for instance, analyze the thickness and elemental composition of coatings just 5 nm thick and test structures of just 10 µm. Features Precise measurement of the thinnest coatings with
- Form Factor: Bench / Rack / Cabinet
- Instrument Type: Material Condition
- Technology: Radiographic / X-ray
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Supplier: Scientific Test, Inc.
Description: Scientific Test provides high performance semiconductor testers for testing descrete semiconductor devices at prices significantly below our competitors. With our extremely favorable cost-benefit ratio, you can't afford to overlook evaluating how our semiconductor tester can
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Supplier: Scientific Test, Inc.
Description: Scientific Test provides high performance semiconductor testers for testing descrete semiconductor devices at prices significantly below our competitors. With our extremely favorable cost-benefit ratio, you can't afford to overlook evaluating how our semiconductor tester can
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Supplier: InfraTec GmbH
Description: E-LIT – Automated testing solution system allows non-contact failure inspection of semiconductor material during the manufacturing process. Inhomogeneous temperature distribution, local power loss can be measured with Lock-in Thermography. This is achieved by using the shortest
- Form Factor: Bench / Rack / Cabinet, Monitoring System
- Instrument Type: Flaw Detection
- Technology: Other
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Supplier: NDE Professionals Inc.
Description: NDE Professionals, Inc., incorporated in Oregon in 1991, specializes in providing nondestructive testing and quality consulting to the Commercial Aerospace, Defense, Energy, Maritime, Petrochemical, Pulp and Paper, Semiconductor and Transportation industries. Facilities Over 7
- Capabilities: Certification, Consulting / Training, Field Evaluation / On-site Inspection, In-process / In-line Testing, Proficiency Testing / Interlaboratory, Test Development, Test Fixtures / Equipment, Testing / Simulation, Specialty / Other
- Forms Tested / Certified: Capital Equipment, Components / Parts, Facilities / Capital Structures, Samples or Materials
- Industry: Aerospace / Avionics, Building & Construction, HVAC, Plumbing and Lighting, Industrial / Machinery, Materials, Nuclear / Utility, Piping / Pressure Vessels, Semiconductor / IC Packages, Valves / Pumps, Welding & Fabrication
- Services Offered: Dimensional Gaging / Metrology, NDT / Inspection
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Description: base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.
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Supplier: MTI Instruments Inc.
Description: High resolution, high speed laser displacement sensor (non-contact linear displacement sensor) utilizes the latest CMOS sensor technology that challenges even the most difficult measurement applications. The Microtrak™ 3 is undoubtedly an essential measurement tool for process
- Display & Special Features: Computer Interface / Networkable, SPC / Software Capability
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Nanomaterials, Optics / Photonics, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: Flatness, Runout, Step Height, Thickness, Warp / Bow
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Supplier: Intepro Systems
Description: Highly accelerated life testing of DUT's, junction temperature measurement
- Components / Products Tested: Active Components / Semiconductors
- DUT Interfacing / Adapters: Performance Board / Probe Card
- Options / Module Types: Measure Unit / Monitor, Test Software / Program Generator
- Tester / Test Capability: Life / Endurance Testing
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Supplier: RS Components, Ltd.
Description: The EA-ELR 5000 high-performing micro-processor controlled multi-channel electronic load series offers all essential functions typically required in demanding R&D and industrial testing environments. It is designed for testing electronic components and devices such as semiconductors, analog
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Supplier: RS Components, Ltd.
Description: The EA-ELR 5000 high-performing micro-processor controlled multi-channel electronic load series offers all essential functions typically required in demanding R&D and industrial testing environments. It is designed for testing electronic components and devices such as semiconductors, analog
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Supplier: Element Materials Technology
Description: Element experts measure up For projects that require accurate dimensional measurements, Element Materials Technology dimensional scientists measure up in every way: capabilities, expertise, timeliness, and presentation of your results. Our professional inspection team uses cutting
- Capabilities: Certification, Component / Product Comparison, Failure Analysis / Troubleshooting, Field Evaluation / On-site Inspection, First Article / Contract QA, In-process / In-line Testing, Reverse Engineering / Digitization, Test Development, Test Fixtures / Equipment, Testing / Simulation, Specialty
- Forms Tested / Certified: Capital Equipment, Components / Parts, Facilities / Capital Structures, Products, Samples or Materials
- Industry: Appliances, Aerospace / Avionics, Automotive, Battery / Energy Products, Building & Construction, Combustion Equipment, Consumer Products, Health Care / Medical, HVAC, Plumbing and Lighting, Industrial / Machinery, Instrument & Sensors / Laboratory, Materials, Motors and Control Systems,
- Services Offered: Alignment, Dimensional Gaging / Metrology, Engineering / Design Verification (DVT), Form / Geometry (Straightness, Roundness, etc.), NDT / Inspection, Visual / Video Inspection, Specialty / Other
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Supplier: ValueTronics International, Inc.
Description: The 4141B is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of
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Supplier: ValueTronics International, Inc.
Description: The 4141A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of
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Supplier: ValueTronics International, Inc.
Description: The S900 is a Semiconductor Parameter Analyzer from Keithley. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of
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Supplier: Accutek Testing Laboratory
Description: Accutek's mechanical testing qualifications include: - Tensile (ounces to 60,000+ lbs) - Fatigue (axial, bending, torsion, roller chain) - Rotating Beam - Charpy Impact (NIST Certified) - Hardness (micro to Brinell, including Shore A) - Abrasion (Taber, micro-motion, porous coating) - Torque
- Capabilities: Certification, Component / Product Comparison, Failure Analysis / Troubleshooting, In-process / In-line Testing, Test Development, Test Fixtures / Equipment, Testing / Simulation, Specialty / Other
- Forms Tested / Certified: Components / Parts, Facilities / Capital Structures, Products, Samples or Materials, Other
- Industry: Appliances, Aerospace / Avionics, Automotive, Battery / Energy Products, Building & Construction, Combustion Equipment, Health Care / Medical, HVAC, Plumbing and Lighting, Industrial / Machinery, Instrument & Sensors / Laboratory, Materials, Motors and Control Systems, Nuclear / Utility,
- Services Offered: Dimensional Gaging / Metrology, Engineering / Design Verification (DVT), Specialty / Other
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Supplier: ValueTronics International, Inc.
Description: The 4145B is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of
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Description: IEC 61674:2024 specifies the performance and some related constructional requirements of DIAGNOSTIC DOSIMETERS intended for the measurement of AIR KERMA, AIR KERMA LENGTH PRODUCT or AIR KERMA RATE, in photon radiation fields used in medical X-ray imaging, such as RADIOGRAPHY, RADIOSCOPY and
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Description: IEC 61674:2012 specifies the performance and some related constructional requirements of diagnostic dosimeters intended for the measurement of air kerma, air kerma length product or air kerma rate, in photon radiation fields used in radiography, including mammography, radioscopy and computed
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Supplier: Zygo Corporation
Description: and optical measuring instruments, but you don't have the volume to justify a purchase, ZYGO's Testing & Certification Services is an excellent, cost-effective solution! Our facility is one of the most complete and modern in the industry. We have state-of-the-art equipment for
- Capabilities: Certification, Component / Product Comparison, Consulting / Training, Testing / Simulation
- Forms Tested / Certified: Components / Parts, Samples or Materials, Other
- Industry: Aerospace / Avionics, Health Care / Medical, Semiconductor / IC Packages, Specialty / Other
- Services Offered: Dimensional Gaging / Metrology, Form / Geometry (Straightness, Roundness, etc.), Surface Profilometry
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Supplier: Bruker Corporation
Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and
- Display & Special Features: Computer Interface / Networkable
- Industrial Applications: Electronics, Semiconductor Manufacturing, Other
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
- Mounting / Loading: Benchtop, Floor / Free Standing
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Supplier: HORIBA Instruments, Inc.
Description: The HORIBA CS-700 chemical concentration monitor enables high performance measurement of the individual chemical constituents of complex chemistries used in the leading edge Semiconductor Manufacturing Processes. By improving HORIBA's renowned spectroscopic measurement
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Supplier: Tradeport Electronics Group
Description: DAC-PD-7 is designed to reduce complicated tasks (calibration, wiring, and evaluation) with Partial Discharge (PD) measurements, so that can test PD promptly and easily without the expert knowledge. DAC-PD-7 alone allows all of the tests on PD without peripheral equipment. DAC-PD-7 can
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Supplier: HORIBA Instruments, Inc.
Description: The CS-100 Series monitors measure in real time the concentrations of various types of chemical solutions and have the capability to control the timing of automatic chemical spiking. Measurement is fully automatic; no measurement control is required once the measurements have
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 25x0 laser scanners are designed for industrial measurement tasks. The combination of compact design, versatility and signal stability creates an excellent price/performance ratio, especially for measurement tasks involving large quantities. The scanCONTROL 25x0 laser
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Defects / ADC, Flatness, Parallelism, Roundness, Squareness / Angularity, Step Height, Straightness, Thickness, Warp / Bow
- Mounting / Loading: Other
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Supplier: Micro-Epsilon Group
Description: scanCONTROL 25x0 laser scanners are designed for industrial measurement tasks. The combination of compact design, versatility and signal stability creates an excellent price/performance ratio, especially for measurement tasks involving large quantities. The scanCONTROL 25x0 laser
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Defects / ADC, Flatness, Parallelism, Roundness, Squareness / Angularity, Step Height, Straightness, Thickness, Warp / Bow
- Mounting / Loading: Other
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Supplier: CSA Group
Description: IEC 61674:2012 specifies the performance and some related constructional requirements of diagnostic dosimeters intended for the measurement of air kerma, air kerma length product or air kerma rate, in photon radiation fields used in radiography, including mammography, radioscopy and computed
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Supplier: InspectorTools
Description: controls Assure proper conditions in environmentally sensitive work areas Features Utilizes thin film capacitance sensor for accurate humidity measurements over a 10-95.0% range Semiconductor sensor for temperature measurements of -20 to
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Supplier: Micro-Epsilon Group
Description: The new generation of high precision inline 3D measurements The high-precision surfaceCONTROL 3D 3500 snapshot sensor is used for the automated optical inspection of geometry, shape and surfaces on diffuse reflective surfaces. The surfaceCONTROL 3D 3500 stands out due to its
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: 3D / Areal Topography, Defects / ADC, Flatness, Parallelism, Roundness, Squareness / Angularity, Step Height, Straightness, Warp / Bow
- Operating Temperature: -4 to 158 F
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Supplier: HORIBA Instruments, Inc.
Description: High precision and high performance HF concentration monitor enables micro-process management with +/- 2.0 ppm (highest accuracy), high speed sampling & output, 2-channel sensors, and intra-sensor pressure correction function. Suitable for the semiconductor finest process control
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Supplier: HORIBA Instruments, Inc.
Description: The CS-137 is a high-precision chemical solution concentration monitor designed to meet the strict demands of semiconductor wet-etching processes. Etching processes use BHF solution to etch silicon oxide and remove particles from the wafer surface. The CS-137 continually monitors each
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Supplier: Micro-Epsilon Group
Description: The reflectCONTROL deflectometry sensor is used for shape measurements of shiny objects. This sensor displays a striped pattern which is mirrored by the surface of the measuring object into the sensor cameras. The sensor provides a 3D image of the surface which allows for the topology of the
- Factory / Production Use: Yes
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Optics / Photonics, Precision Machining / Grinding, Semiconductor Manufacturing
- Measurement Capability: 3D / Areal Topography, Defects / ADC, Flatness, Parallelism, Roundness, Squareness / Angularity, Step Height, Straightness, Warp / Bow
- Mounting / Loading: Other
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Supplier: Vaisala
Description: For Remote Installations in Tight Spaces Vaisala DRYCAP® Dew Point and Temperature Probe DMP7 is made for tight spaces and low-humidity applications. Its short probe length makes it suitable for installations that have limited space such as semiconductor manufacturing equipment
- Dew Point Accuracy: 3.6 +/-F
- Dew Point Range: -94 to 176 F
- Digital Outputs: Serial Interface
- Form Factor: Sensor / Probe
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Featured Products Top
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Cannot find a part with the specs you need? Would you like to use a device outside of its catalog standard performance? Having yield issues? Richardson RFPD offers custom testing, sorting, and binning of semiconductors to your exact (read more)
Browse RF Transistors Datasheets for Richardson RFPD -
Pressure Gauges JG Series Product Features • Pressure gauges are designed for general and laboratory applications involving the measurement of compressed gases compatible with the materials of construction. • Gauges are used to (read more)
Browse Pressure Gauges Datasheets for Shenzhen Jewellok Technology Co., Ltd. -
Tolerances on Temperature/Humidity – Most of our customers working with environmental control in a semiconductor environment require material stability and measurement accuracy that comes from semiconductor temperature control. Whether you work in lithography, photomask (read more)
Browse Environmental Control Systems Datasheets for Air Innovations LLC -
Capacitive Ceramic Pressure Sensors for Vacuum Gauge in Semiconductor Industry The application: Vacuum gauges are essential instruments for measuring and monitoring vacuum level in various industries. In semiconductor manufacturing, vacuum gauges (read more)
Browse Pressure Sensors Datasheets for Endress + Hauser – Sensors & Components -
Smiths Interconnect today announced the launch of DaVinci Gen V, the latest flagship product in its DaVinci series portfolio. The product rigorously tests semiconductor chips during the manufacturing process to ensure they provide ultra-reliable and repeatable performance. This is important (read more)
Browse IC Interconnect Components Datasheets for Molex Signal Tech Industrial Ltd. -
This contributes to energy savings and production process solutions. Our S-Flow Flowmeter provides easy clamp-on type by simply tightening 4 screws, no need for pipe modification, integrated detector and flow transmitter, and built-in temperature sensor enables simultaneous measurement of flow (read more)
Browse Flow Meters Datasheets for Fuji Electric Corp. of America -
Marposs has been a trusted partner in delivering advanced measurement solutions for the semiconductor industry. Thanks to deep expertise in metrology and wafer inspection, we support customers in identifying the most suitable solutions for monitoring material thickness and the so (read more)
Browse Dimensional Gages and Instruments Datasheets for Marposs Corp -
Thin transparent thin films are critical across a variety of markets and applications, including consumer electronics, semiconductors and optics. Precise monitoring and control of thin film processes is achieved by measuring top surface, thickness, and substrate surface characteristics - all of (read more)
Browse Thin Film Coating Services Datasheets for Zygo Corporation -
in various applications. In electrical circuits like circuit breakers in SF6 Gas, or moisture level control in hydrogen gas to cool generators. The applications in the semiconductor and the medical industry are mainly moisture content control in process gases and in (read more)
Browse Moisture Meters Datasheets for Innovative Sensor Technology IST USA Division -
The MeasureReady™ M91 FastHall™ measurement controller is a revolutionary, all-in-one instrument that delivers significantly higher levels of precision, speed, and convenience to researchers involved in the study of electronic materials. Featuring Lake Shore’s (read more)
Browse Magnetic Field Instruments Datasheets for Lake Shore Cryotronics, Inc.
Conduct Research Top
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Measurement, Control, and Improvement in Reclaim/Recycle/Reuse for Semiconductors
equipment. Some use water as a central ingredient in the products they sell. The world's water resources are becoming strained, and during the fast-paced growth of the semiconductor industry over the last several decades, water has become an increasingly precious commodity.
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Semiconductor: Dissolved Ozone Measurement in Semiconductor Ultrapure Water Systems
measurements are made to insure proper dosage control is maintained after injection and then to insure residual ozone is eliminated by UV exposure. At this point any residual ozone becomes an unwanted contaminant and contributes to increased oxygen levels, which can affect the performance of a downstream
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Trace Silica Measurement in the Semiconductor and Power Industries
In the production of high purity water, dissolved silica is known to be the first ion to breakthrough when the ion-exchanger resin approaches depletion. Therefore, rinse water quality is critical to minimize defects and ensure proper performance. Much work has been done in the past decade in
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RF Reflectometry Measurements of Quantum Dots
Characterizing semiconductor spin qubits with radio-frequency (RF) reflectometry offers a speed advantage over low-frequency conductance measurements thanks to insensitivity to 1/f noise.
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Ultra-High Precision AFM with 6-Axis Laser and Piezo Scanner for Traceable Measurements on Semiconductors and Step Standards
Atomic force microscopy (AFM) is used for surface measurements with resolution down to atomic levels - dimensions that are far beyond even the highest resolution optical microscopes. AFM is a noncontact procedure, with forces between a very fine measuring tip and the object surface revealing
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Traceability of Measurements: Ensuring Reliable Performance of Critical TOC Instruments
The use of total organic carbon (TOC) measurements has become a widespread best. practice throughout the pharmaceutical, semiconductor, municipal water treatment,. and wastewater industries. Many industry-leading companies and organizations. are using TOC for specific manufacturing applications
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Load Cell Enhancement Using Micron Instruments' Semiconductor Strain Gages
A load cell is a transducer that converts an input force into a measurable electrical output. Load cells are built with different force measurement devices; however, strain gage load cells are the most common choice. Strain gages convert mechanical motion into an electronic signal. A change
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Understanding In-Line RF Power Measurements
Accurate energy demands on rf generating equipment for semiconductor processing continue to grow. As IC geometries shrink, so do process parameter tolerances. The actual amount, frequency spectrum and time duration of rf energy applied to a process has become increasingly critical to process
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Cloud computing-based jam management for a manufacturing system in a Green IT environment
2.4 Semiconductor measurement equipment system; IC test handler .
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4,4′‐Spirobi[cyclopenta[2,1‐ b ;3,4‐ b ′]dithiophene: A New Generation of Heterocyclic Spiro‐Type Molecules
FET characteristics were measured under vacuum (∼ 4 × 10–3 mbar) for fresh device and re- corded with a Keithley 4200 Semiconductor Measurement System equipped with a preamplifier for improving low-current measure- ment.
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… and Colorado Springs
One drawback with Josephson electronics is that in many cases the semiconductor -based measuring equipment stops working well before the limit of the former is reached.
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The leakage current mechanism of PZT thin films deposited by in-situ sputtering
Leak- age current at various voltages was measured using a HP 4145B semiconductor parameter measurement equipment .
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The mechanism of the response of lipds mimicking olfactory sensors to odorants
HP 4063 semiconductor parameter measure equipment .
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R&D Centre Database - World + Regions - H1 2015
Test and measurement equipment , Semiconductor chips .
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CyberOptics Semiconductor Demonstrates Wireless Metrology Systems
• The WaferSense Automatic Teaching System (ATS) uses machine vision technology to "see" inside semiconductor equipment and measure three-dimensional offsets to teach wafer transfer positions resulting in significantly reduced equipment downtime and wafer scrap.
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CyberOptics Semiconductor Demonstrates Wireless Metrology Systems
• The WaferSense Automatic Teaching System (ATS) uses machine vision technology to "see" inside semiconductor equipment and measure three-dimensional offsets to teach wafer transfer positions resulting in significantly reduced equipment downtime and wafer scrap.