Products & Services
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Supplier: CHINO Works America Inc.
Description: The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
- Component / Product Tested: Active Components / Semiconductors, Boards - Loaded PCB, MEMS / Sensors, Optoelectronics / Fiber Optics, Passive Components, Power Supplies / Transformers
- Features: Burn-in, Fault Diagnostics / Logic Analysis, Temperature Controller
- Interface: Flying Prober / Scanner
- Tester / Test Capability: Functional Test (Performance), Life / Endurance Testing
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Supplier: CSA Group
Description: IEC 60204-33:2009 applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors. It is applicable to the electrical equipment or parts of the
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Description: IEC 60204-33:2009 applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors. It is applicable to the electrical equipment or parts of the
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Supplier: Accuris
Description: Industrial, scientific and medical equipment \x96 Radio-frequency disturbance characteristics \x96 Limits and methods of measurement \x96 Amendment 2: Requirements for semiconductor power converters (SPC)
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Supplier: Hamamatsu Photonics Europe
Description: semiconductor manufacturing equipment. Allows multichannel measurement in real time, which provides simultaneous multichannel measurement and multipoint measurement on film surfaces. At the same time it can also measure reflectivity (transmittance), object color,
- Range: 0.000000787402 to 0.00393701 inch
- Measurement Scale / Units: Metric
- Gaging Technology: Optical
- Attribute Measurement Capability: Thickness Gage
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Description: IEC 61674:2012 specifies the performance and some related constructional requirements of diagnostic dosimeters intended for the measurement of air kerma, air kerma length product or air kerma rate, in photon radiation fields used in radiography, including mammography, radioscopy and computed
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Supplier: CSA Group
Description: IEC 61674:2012 specifies the performance and some related constructional requirements of diagnostic dosimeters intended for the measurement of air kerma, air kerma length product or air kerma rate, in photon radiation fields used in radiography, including mammography, radioscopy and computed
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Description: Specifies the performance and some related constructional requirements of diagnostic dosimeters intended for the measurement of air Kerma, air Kerma length or air Kerma rate, in photon radiation fields used in radiography, including mammography, radioscopy and computed tomography (CT), for
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Supplier: Tradeport Electronics Group
Description: DAC-PD-7 is designed to reduce complicated tasks (calibration, wiring, and evaluation) with Partial Discharge (PD) measurements, so that can test PD promptly and easily without the expert knowledge. DAC-PD-7 alone allows all of the tests on PD without peripheral equipment. DAC-PD-7 can
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Supplier: Scientific Test, Inc.
Description: Scientific Test provides high performance semiconductor testers for testing descrete semiconductor devices at prices significantly below our competitors. With our extremely favorable cost-benefit ratio, you can't afford to overlook evaluating how our semiconductor tester can
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Supplier: ValueTronics International, Inc.
Description: The 4141A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of
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Supplier: InfraTec GmbH
Description: E-LIT – Automated testing solution system allows non-contact failure inspection of semiconductor material during the manufacturing process. Inhomogeneous temperature distribution, local power loss can be measured with Lock-in Thermography. This is achieved by using the shortest
- Form Factor: Bench / Rack / Cabinet, Monitoring System
- Instrument Type: Flaw Detection
- Features: Other
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Supplier: Micro-Epsilon Group
Description: 3D HLP's ability to generate a detailed 3D representation of the surface, which can be used to accurately determine the topology of components, such as flatness, deflection and curvature. The RCS130-160 3D HLP is specially optimized for measurement and inspection tasks in production lines. It
- Vertical (Z) Range: 6.8897675 to 8.8582725 inch
- Lateral (X) Resolution: 0.00393701 inch
- Traverse Length: 6.299216 inch
- Operating Temperature: 32 to 104 F
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Supplier: Fischer Technology, Inc.
Description: distance (up to 80 mm) Automated serial testing with programmable XY-table and Z-axis (optional) Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device) Applications: Coating Thickness Measurement Measurement of
- X-ray Operating Voltage: 30 to 50 kilovolts
- Focal Spot Size: 100 µm
- Form Factor: Bench / Rack / Cabinet
- Features: Material Condition
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Description: Conditions for carrier-to-noise ratio of Table 1 in Clause 4 is amended. - Error in the equation for carrier-to-noise ratio in 5.2.2 is corrected; - Precaution against the equipment used for carrier-to-noise ratio measurement is added in 5.2.2; - Explanation for the measurement
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Supplier: CSA Group
Description: for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.
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Supplier: Fischer Technology, Inc.
Description: distance (up to 80 mm) Automated serial testing with programmable XY-table and Z-axis (optional) Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device) Applications: Coating Thickness Measurement Measurement of
- X-ray Operating Voltage: 10 to 50 kilovolts
- Focal Spot Size: 100 to 150 µm
- Form Factor: Bench / Rack / Cabinet
- Features: Material Condition
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Description: The m924 (4channel) and m922 (2channel) Semiconductor OEM modules are the newest Luxtron products for Etcher and Wafer Fab equipment temperature monitoring of Electrostatic Chucks, Chambers and other devices. The m920 Series modules are high performance solutions that are flexible,
- Temperature Range: -49 to 626 F
- Operating Temperature: 32 to 140 F
- Electrical Output: Current, Serial
- Technology: Optical Pyrometer
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Supplier: CSA Group
Description: cable harness. This test method is used to inject RF current on one or a combination of wires. This standard establishes a common base for the evaluation of semiconductor devices to be applied in equipment used in environments that are subject to unwanted radio frequency
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Supplier: AENOR
Description: Procedure for the determination of ambient radioactivity. Measurement equipment. Part 1: Gamma spectrometry by semiconductor sensors.
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Supplier: AENOR
Description: Procedure for the determination of ambient radioactivity. Measurement equipment. Part 2: Alpha spectrometry by semiconductor sensors.
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Supplier: Fischer Technology, Inc.
Description: very demanding measurement tasks. Using XDV devices you can, for instance, analyze the thickness and elemental composition of coatings just 5 nm thick and test structures of just 10 µm. Features Precise measurement of the thinnest coatings with repeatable accuracy, thanks to
- X-ray Operating Voltage: 10 to 50 kilovolts
- Focal Spot Size: 250 µm
- Form Factor: Bench / Rack / Cabinet
- Features: Material Condition
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Supplier: HORIBA Instruments, Inc.
Description: The HORIBA CS-700 chemical concentration monitor enables high performance measurement of the individual chemical constituents of complex chemistries used in the leading edge Semiconductor Manufacturing Processes. By improving HORIBA's renowned spectroscopic measurement
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Supplier: Shenzhen Jewellok Technology Co., Ltd.
Description: Ultra-High Purity CDS and CDM Chemical Delivery and Dilution for Semiconductor Manufacturing Shenzhen Jewellok Technology Co., Ltd. provides advanced ultra-high purity (UHP) chemical handling solutions, including chemical delivery module (CDM) and chemical delivery system (CDS). Jewellok’s
- Body Material: Stainless Steel
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Supplier: HORIBA Instruments, Inc.
Description: High precision and high performance HF concentration monitor enables micro-process management with +/- 2.0 ppm (highest accuracy), high speed sampling & output, 2-channel sensors, and intra-sensor pressure correction function. Suitable for the semiconductor finest process control. High
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Supplier: HORIBA Instruments, Inc.
Description: enabling a high level of repeatability of your cleaning process. As a result, lot defects decrease in the cleaning process, which helps to boost the overall yield. Fully automated measurement simplifies control Measurement is fully automatic, no control is required once the system has
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Supplier: HORIBA Instruments, Inc.
Description: fully automatic, so no control whatsoever is required once the measurement has begun. In addition, air is used for reference spectral measurement, so a utility water supply is not needed. Comprehensive measures to eliminate air bubbles enable measurement of high-temperature
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Supplier: Cosmic Equipment SpA
Description: The VIP Ultra by Cosmic is a next-generation, ultra-high throughput ATE (Automatic Test Equipment) engineered for power-semiconductor testing-ideal for Si, SiC, GaN discrete devices, power modules, and high-/low-side driver ICs. Designed for cleanroom integration, it delivers
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
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Supplier: Cosmic Equipment SpA
Description: The VIP Ultra by Cosmic is a next-generation, ultra-high throughput ATE (Automatic Test Equipment) engineered for power-semiconductor testing-ideal for Si, SiC, GaN discrete devices, power modules, and high-/low-side driver ICs. Designed for cleanroom integration, it delivers
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
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Supplier: Cosmic Equipment SpA
Description: The VIP Ultra by Cosmic is a next-generation, ultra-high throughput ATE (Automatic Test Equipment) engineered for power-semiconductor testing-ideal for Si, SiC, GaN discrete devices, power modules, and high-/low-side driver ICs. Designed for cleanroom integration, it delivers
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
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Supplier: NDE Professionals Inc.
Description: NDE Professionals, Inc., incorporated in Oregon in 1991, specializes in providing nondestructive testing and quality consulting to the Commercial Aerospace, Defense, Energy, Maritime, Petrochemical, Pulp and Paper, Semiconductor and Transportation industries. Facilities Over 7,400 square feet
- Applications / Industry: Aerospace / Avionics, Building & Construction, HVAC, Plumbing and Lighting, Industrial / Machinery, Materials, Nuclear / Utility, Piping / Pressure Vessels, Semiconductor / IC Packages, Valves / Pumps, Welding & Fabrication
- Forms Tested / Certified: Capital Equipment, Components / Parts, Facilities / Capital Structures, Samples or Materials
- Capabilities: Certification, Consulting / Training, Field Evaluation / On-site Inspection, In-process / In-line Testing, Proficiency Testing / Interlaboratory, Test Development, Test Fixtures / Equipment, Testing / Simulation
- Services Offered: Dimensional Gaging / Metrology, NDT / Inspection
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Supplier: ValueTronics International, Inc.
Description: swept voltage to two terminals of the EUT, measuring the level of current flowing at each voltage. Additional Features: High Precision Measurements of Semiconductor Devices Up to 2000 Volts or 10 Amp Sourcing Up to 220 Watts 1 Nanoamp Measurement Resolution Down to 2 Millivolt
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Supplier: Cosmic Equipment SpA
Description: platform, the Flexible configuration supports plug-in options such as high-voltage extensions, high-current pulse modules, digitizers, and Rg measurement capability. This scalability ensures that the system adapts easily to changing device portfolios without requiring extensive redesign or
- Component / Product Tested: Active Components / Semiconductors
- Type / Form: Measure Unit / Monitor, Test Platform / System
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Supplier: Zygo Corporation
Description: instruments, but you don't have the volume to justify a purchase, ZYGO's Testing & Certification Services is an excellent, cost-effective solution! Our facility is one of the most complete and modern in the industry. We have state-of-the-art equipment for testing: Microroughness of precision
- Applications / Industry: Aerospace / Avionics, Health Care / Medical, Semiconductor / IC Packages
- Capabilities: Certification, Component / Product Comparison, Consulting / Training, Testing / Simulation
- Forms Tested / Certified: Components / Parts, Samples or Materials
- Services Offered: Dimensional Gaging / Metrology, Form / Geometry (Straightness, Roundness, etc.), Surface Profilometry
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Supplier: Piezo-Metrics
Description: diaphragm is applied through the hole in the nose which is then converted to an electric signal proportional to the pressure. APPLICATIONS Test & Measurement Equipment Product Equipment & Controls Energy Controls Laboratory Instruments & Equipment Liquid Level Calibration
- Working Pressure Range: 7,000 psi
- Operating Temperature: 0 to 180 F
- Measurement Type: Gauge
- Media: Liquid
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Featured Products Top
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Cannot find a part with the specs you need? Would you like to use a device outside of its catalog standard performance? Having yield issues? Richardson RFPD offers custom testing, sorting, and binning of semiconductors to your exact (read more)
Browse RF Transistors Datasheets for Richardson RFPD -
Pressure Gauges JG Series Product Features • Pressure gauges are designed for general and laboratory applications involving the measurement of compressed gases compatible with the materials of construction. • Gauges are used to (read more)
Browse Pressure Gauges Datasheets for Shenzhen Jewellok Technology Co., Ltd. -
Tolerances on Temperature/Humidity – Most of our customers working with environmental control in a semiconductor environment require material stability and measurement accuracy that comes from semiconductor temperature control. Whether you work in lithography, photomask (read more)
Browse Environmental Control Systems Datasheets for Air Innovations LLC -
Capacitive Ceramic Pressure Sensors for Vacuum Gauge in Semiconductor Industry The application: Vacuum gauges are essential instruments for measuring and monitoring vacuum level in various industries. In semiconductor manufacturing, vacuum gauges (read more)
Browse Pressure Sensors Datasheets for Endress + Hauser – Sensors & Components -
Smiths Interconnect today announced the launch of DaVinci Gen V, the latest flagship product in its DaVinci series portfolio. The product rigorously tests semiconductor chips during the manufacturing process to ensure they provide ultra-reliable and repeatable performance. This is important (read more)
Browse IC Interconnect Components Datasheets for Molex Signal Tech Industrial Ltd. -
This contributes to energy savings and production process solutions. Our S-Flow Flowmeter provides easy clamp-on type by simply tightening 4 screws, no need for pipe modification, integrated detector and flow transmitter, and built-in temperature sensor enables simultaneous measurement of flow (read more)
Browse Flow Meters Datasheets for Fuji Electric Corp. of America -
Marposs has been a trusted partner in delivering advanced measurement solutions for the semiconductor industry. Thanks to deep expertise in metrology and wafer inspection, we support customers in identifying the most suitable solutions for monitoring material thickness and the so (read more)
Browse Dimensional Gages and Instruments Datasheets for Marposs Corp -
in various applications. In electrical circuits like circuit breakers in SF6 Gas, or moisture level control in hydrogen gas to cool generators. The applications in the semiconductor and the medical industry are mainly moisture content control in process gases and in (read more)
Browse Moisture Meters Datasheets for Innovative Sensor Technology IST USA Division -
The MeasureReady™ M91 FastHall™ measurement controller is a revolutionary, all-in-one instrument that delivers significantly higher levels of precision, speed, and convenience to researchers involved in the study of electronic materials. Featuring Lake Shore’s (read more)
Browse Magnetic Field Instruments Datasheets for Lake Shore Cryotronics, Inc. -
modular design, sensor systems that have already been purchased can be enlarged easily. The capaNCDT 6200 series is a unique modular multi-channel measurement system for (read more)
Browse Capacitive Linear Position Sensors Datasheets for Micro-Epsilon Group
Conduct Research Top
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Measurement, Control, and Improvement in Reclaim/Recycle/Reuse for Semiconductors
equipment. Some use water as a central ingredient in the products they sell. The world's water resources are becoming strained, and during the fast-paced growth of the semiconductor industry over the last several decades, water has become an increasingly precious commodity.
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Semiconductor: Dissolved Ozone Measurement in Semiconductor Ultrapure Water Systems
measurements are made to insure proper dosage control is maintained after injection and then to insure residual ozone is eliminated by UV exposure. At this point any residual ozone becomes an unwanted contaminant and contributes to increased oxygen levels, which can affect the performance of a downstream
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Trace Silica Measurement in the Semiconductor and Power Industries
In the production of high purity water, dissolved silica is known to be the first ion to breakthrough when the ion-exchanger resin approaches depletion. Therefore, rinse water quality is critical to minimize defects and ensure proper performance. Much work has been done in the past decade in
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RF Reflectometry Measurements of Quantum Dots
Characterizing semiconductor spin qubits with radio-frequency (RF) reflectometry offers a speed advantage over low-frequency conductance measurements thanks to insensitivity to 1/f noise.
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Ultra-High Precision AFM with 6-Axis Laser and Piezo Scanner for Traceable Measurements on Semiconductors and Step Standards
Atomic force microscopy (AFM) is used for surface measurements with resolution down to atomic levels - dimensions that are far beyond even the highest resolution optical microscopes. AFM is a noncontact procedure, with forces between a very fine measuring tip and the object surface revealing
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Traceability of Measurements: Ensuring Reliable Performance of Critical TOC Instruments
The use of total organic carbon (TOC) measurements has become a widespread best. practice throughout the pharmaceutical, semiconductor, municipal water treatment,. and wastewater industries. Many industry-leading companies and organizations. are using TOC for specific manufacturing applications
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Load Cell Enhancement Using Micron Instruments' Semiconductor Strain Gages
A load cell is a transducer that converts an input force into a measurable electrical output. Load cells are built with different force measurement devices; however, strain gage load cells are the most common choice. Strain gages convert mechanical motion into an electronic signal. A change
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Understanding In-Line RF Power Measurements
Accurate energy demands on rf generating equipment for semiconductor processing continue to grow. As IC geometries shrink, so do process parameter tolerances. The actual amount, frequency spectrum and time duration of rf energy applied to a process has become increasingly critical to process
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Cloud computing-based jam management for a manufacturing system in a Green IT environment
2.4 Semiconductor measurement equipment system; IC test handler .
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4,4′‐Spirobi[cyclopenta[2,1‐ b ;3,4‐ b ′]dithiophene: A New Generation of Heterocyclic Spiro‐Type Molecules
FET characteristics were measured under vacuum (∼ 4 × 10–3 mbar) for fresh device and re- corded with a Keithley 4200 Semiconductor Measurement System equipped with a preamplifier for improving low-current measure- ment.
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… and Colorado Springs
One drawback with Josephson electronics is that in many cases the semiconductor -based measuring equipment stops working well before the limit of the former is reached.
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The leakage current mechanism of PZT thin films deposited by in-situ sputtering
Leak- age current at various voltages was measured using a HP 4145B semiconductor parameter measurement equipment .
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The mechanism of the response of lipds mimicking olfactory sensors to odorants
HP 4063 semiconductor parameter measure equipment .
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R&D Centre Database - World + Regions - H1 2015
Test and measurement equipment , Semiconductor chips .
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CyberOptics Semiconductor Demonstrates Wireless Metrology Systems
• The WaferSense Automatic Teaching System (ATS) uses machine vision technology to "see" inside semiconductor equipment and measure three-dimensional offsets to teach wafer transfer positions resulting in significantly reduced equipment downtime and wafer scrap.
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CyberOptics Semiconductor Demonstrates Wireless Metrology Systems
• The WaferSense Automatic Teaching System (ATS) uses machine vision technology to "see" inside semiconductor equipment and measure three-dimensional offsets to teach wafer transfer positions resulting in significantly reduced equipment downtime and wafer scrap.