Materials Analysis Imaging Workstations
from Nikon Metrology
The VMA-4540V/4540 CNC video measuring system provides a large XYZ stroke and a wide field of view. The touch-probe-ready model VMA-4540 is ideal for a wide variety of industrial measuring applications. The VMA-4540V/4540 is designed for high-accuracy measurement of a variety of work pieces. A wide... [See More]
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis; Production & Quality Control
- Image Source: Optical Microscope
- System Type: Turnkey / Complete System
from Smartmore Corporation Limited
Dkam series is a highly integrated 3D camera with high precision, large depth of field (using MEMS micro-galvanometer scanning to achieve a focal projection, that is, the projected coded structured light pattern is clear at any position or under curved surfaces), low cost ( It adopts self-developed... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Bus Type: GigE
- Operating System: Windows Linux
- Stage Type: X-Y-Z Stage; Rotary Positioner
from Phenom-World BV
The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention. The backscattered-electron detector (BSED) and... [See More]
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- Image Source: Electron Microscope
- System Type: Modular / PC-Based
- Modules Included: Imaging & Analysis Software
from Fritsch GmbH - Milling and Sizing
The ANALYSETTE 22 NanoTec with its especially wide measuring range of 0.01 – 2100 µm is the ideal, universally applicable Laser Particle Sizer for efficient particle size analysis down into the nano range – in production and quality control as well as in research and development. [See More]
- Applications: Materials Analysis
- Stage Type: None
from Nikon Metrology
Magnification, AF and illumination conditions can be finely adjusted for each specimen. VMZ-R6555 offers 650 x 550 mm stroke, which is suitable for large components and "step-and-repeat" measurements of multiple pieces on the stage. Key benefits. Six types of optical zooming head. Detection of 0.1... [See More]
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis; Production & Quality Control
- Image Source: Optical Microscope
- System Type: Turnkey / Complete System
from Smartmore Corporation Limited
A set of lightweight 3D vision system suitable for robotic arm installation. The sensor can be connected and mounted on the robotic arm, and can reach the working point with the movement of the robotic arm, which can get rid of the limitation of fixed installation field of view and expand the... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Modules Included: Cameras or Imagers; Imaging Illuminators
- Stage Type: X-Y-Z Stage; Rotary Positioner; Camera Positioner
- Features: AlarmAlarm or Reject Trigger
from Phenom-World BV
The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures... [See More]
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- Image Source: Electron Microscope
- System Type: Modular / PC-Based
- Modules Included: Imaging & Analysis Software
from Fritsch GmbH - Milling and Sizing
For fast analysis of Particle Shape and Size with Dynamic Image Analysis. of powders and bulk solids. Overview of the features: Extra wide measuring range 20 μm – 20 mm. High-performance camera with 4 lenses. Comprehensive library for morphological analysis. Practical tools for reliable... [See More]
- Applications: Materials Analysis
- Stage Type: None
from Smartmore Corporation Limited
This model is suitable for small workpiece in scenarios such as loading and unloading, small frame/tray sorting, and assembly. It is small in size, and has high precision and high cycle time, and can be fast deployed, and conveniently maintained. The accuracy can reach ±0.03mm, the point cloud... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Modules Included: Cameras or Imagers; Imaging Illuminators
- Stage Type: X-Y-Z Stage; Rotary Positioner; Camera Positioner
- Features: AlarmAlarm or Reject Trigger
from Phenom-World BV
The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs. The Phenom Pure provides high-quality... [See More]
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- Image Source: Electron Microscope
- System Type: Modular / PC-Based
- Modules Included: Imaging & Analysis Software
from Smartmore Corporation Limited
SMore 3D camera （SMI-3DSL-3000-01 ）,it is a professional product for 3D positioning guidance and 3D measurement, and it has high precision and is also an industrial aluminum alloy shell. It is integrally formed and can meet various harsh working conditions. High frame rate: 3fps. Ultra... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Modules Included: Cameras or Imagers; Imaging Illuminators
- Stage Type: X-Y-Z Stage; Rotary Positioner; Camera Positioner
- Features: AlarmAlarm or Reject Trigger