Cameras or Imagers Imaging Workstations
from Pleora Technologies Inc.
Fully integrated system is easily trained on your unique requirements to automate manual tasks and add decision-support for operators and inspectors [See More]
- System Type: Embedded / Vision Engine; Turnkey / Complete System
- Modules Included: Cameras or Imagers; Imaging & Analysis Software
- Applications: Assembly Quality; Bar / Matrix Code; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Optical Character Recognition (OCR); Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Tool & Die Monitoring; Quality inspection
from KEYENCE
CV-X100 Series Intuitive Auto-Teaching Machine Vision System. Power Meets Simplicity. Auto-Teach Inspection. Intuitive Programming Interface. Point and Click Geometric Measurement. Auto-Generate Manual. Full vision toolset (including 1D/2D/OCR). Intuitive interface allows users of all levels to... [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based
- Network: Ethernet TCP/IP, EtherNet/IP, PROFINET,PLC-Link, Discrete I/O, Serial
- Inspection Rate: 212
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Optical Character Recognition (OCR); Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Tool & Die Monitoring; Web Inspection; Position / Angle
from Malvern Instruments, Inc.
The SyNIRgi NIR-CI (Near Infrared Chemical Imaging) is a rapid, robust and flexible Chemical Imaging system with a wide sampling dynamic range and depth of field that allows the analysis of curved tablets, whole granules and anything in between. The SyNIRgi NIR-CI delivers spatial and chemical... [See More]
- Applications: Biotechnology or Medical; Production & Quality Control
- Stage Type: X-Y-Z Stage
- Image Source: Thermal or Infrared
- Modules Included: Cameras or Imagers; Imaging Illuminators; Imaging & Analysis Software
from Smartmore Corporation Limited
Dkam series is a highly integrated 3D camera with high precision, large depth of field (using MEMS micro-galvanometer scanning to achieve a focal projection, that is, the projected coded structured light pattern is clear at any position or under curved surfaces), low cost ( It adopts self-developed... [See More]
- Operating System: Windows Linux
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Bus Type: GigE
- Stage Type: X-Y-Z Stage; Rotary Positioner
from WDI Wise Device Inc.
WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The microscope features a sturdy... [See More]
- System Type: Modular / PC-Based
- Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Production & Quality Control; Bare Glass Thickness and Defect
- Network: RS232
- Image Source: Line Scan Camera; Optical Microscope; Confocal Laser
from Nanotronics Imaging
The Nanotronics Imaging nSpec ® is an inspection device designed for high resolution microscopy and detection of wafer defects. With particular application in silicon carbide and Galium Nitride epi wafers, the nSpec ® offers fast quantification and qualification of defects with detailed... [See More]
- System Type: Modular / PC-Based
- Image Source: Optical Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y Stage; Camera Positioner
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage
from KPM Analytics
A compact, ‘plug-and-play ’, full-colour 2D/3D QA Measurement System designed to provide critical measurements accurately, faster and with better repeatability than manual methods, while providing the ability to measure and quantify product attributes that are difficult or impossible to... [See More]
- System Type: Turnkey / Complete System
- Operating System: Windows 10 Professional or Enterprise
- Inspection Rate: 10
- Applications: Food & Beverage
from KEYENCE
General-purpose Model [IM-6015] Just place and press. A totally new dimension measurement system born from a new concept which eliminates the need for X-Y stages. With a built-in ΓΈ100 optical lens, this model enables all points in the entire field of view to be measured in a batch. Field of view:... [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based
- Mass Storage: 160
- Feature Resolution: 0.0400
- Bus Type: USB
from Smartmore Corporation Limited
A set of lightweight 3D vision system suitable for robotic arm installation. The sensor can be connected and mounted on the robotic arm, and can reach the working point with the movement of the robotic arm, which can get rid of the limitation of fixed installation field of view and expand the... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Modules Included: Cameras or Imagers; Imaging Illuminators
- Stage Type: X-Y-Z Stage; Rotary Positioner; Camera Positioner
- Features: AlarmAlarm or Reject Trigger
from WDI Wise Device Inc.
This is the only commercially available microscope guaranteeing transmission of more then 80% for all four YAG laser harmonics: 266, 355, 532, and 1064nm - without compromising the review channel fidelity. The MIC4 microscope is instrumental in laser repair of TFT arrays over the wavelength ranging... [See More]
- System Type: Modular / PC-Based
- Image Source: Line Scan Camera; Thermal or Infrared (optional feature); Optical Microscope; Confocal Laser
- Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Production & Quality Control; Thin Film Thickness, Mask Align
- Stage Type: None
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 0.0050
- Image Source: Electron Microscope
from KEYENCE
Wide-field Model [IM-6120] Just place and press even for large targets. Redesigned from the ground up, this dimension measurement system allows measurements for a whole part to be carried out in an instant. The Wide-Field Model gives you a 200mm x 100mm field of view to fit even more parts [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based
- Mass Storage: 160
- Feature Resolution: 0.0200
- Bus Type: USB
from Smartmore Corporation Limited
This model is suitable for small workpiece in scenarios such as loading and unloading, small frame/tray sorting, and assembly. It is small in size, and has high precision and high cycle time, and can be fast deployed, and conveniently maintained. The accuracy can reach ±0.03mm, the point cloud... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Modules Included: Cameras or Imagers; Imaging Illuminators
- Stage Type: X-Y-Z Stage; Rotary Positioner; Camera Positioner
- Features: AlarmAlarm or Reject Trigger
from WDI Wise Device Inc.
The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications. [See More]
- System Type: Modular / PC-Based
- Image Source: Area Scan Camera (optional feature); Line Scan Camera (optional feature); Thermal or Infrared; Optical Microscope; Confocal Laser
- Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Production & Quality Control
- Stage Type: X-Y Stage; Camera Positioner
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 5.00E-4
- Image Source: Electron Microscope
from KEYENCE
High-precision Model [IM-6140] Just place and press even for micro machined parts. An innovative stage designed for reducing measurement time achieves place-and-press measurement even for micro machined parts. Hundreds of points can be measured in seconds without concerns of target placement and... [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based
- Mass Storage: 160
- Feature Resolution: 0.0040
- Bus Type: USB
from Smartmore Corporation Limited
SMore 3D camera （SMI-3DSL-3000-01 ）,it is a professional product for 3D positioning guidance and 3D measurement, and it has high precision and is also an industrial aluminum alloy shell. It is integrally formed and can meet various harsh working conditions. High frame rate: 3fps. Ultra... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Modules Included: Cameras or Imagers; Imaging Illuminators
- Stage Type: X-Y-Z Stage; Rotary Positioner; Camera Positioner
- Features: AlarmAlarm or Reject Trigger
from WDI Wise Device Inc.
Autofocus sensor designed specifically for live animal research. Compensates for live animal motions for example breathing heartbeat, pulse and maintains confocal microscopes in focus at all times. Handles both slow and fast 'focus drift'. Is compatible with most microscope models. [See More]
- System Type: Modular / PC-Based
- Image Source: Area Scan Camera (optional feature); Line Scan Camera (optional feature); Thermal or Infrared; Optical Microscope; Confocal Laser
- Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Production & Quality Control
- Stage Type: X-Y Stage; Camera Positioner
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage
from Smartmore Corporation Limited
1. Integrate common operators to directly obtain measured data and results;. 2. Adopt high-resolution photosensitive sensor with high precision;. 3. Easy to install and no need for high-precision complex motion mechanism;. 4. Static design without motion error;. 5. Large field of view area scan and... [See More]
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Materials Analysis; Non-contact Profilometry; Optical Character Recognition (OCR); Parcel / Baggage Sorting; Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Security & Biometrics; Tool & Die Monitoring
- Modules Included: Cameras or Imagers; Imaging Illuminators
- Stage Type: X-Y-Z Stage; Rotary Positioner; Camera Positioner
- Features: AlarmAlarm or Reject Trigger
from SemiProbe
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage