Imaging & Analysis Software Imaging Workstations
from Nanotronics Imaging
The Nanotronics Imaging nSpec ® is an inspection device designed for high resolution microscopy and detection of wafer defects. With particular application in silicon carbide and Galium Nitride epi wafers, the nSpec ® offers fast quantification and qualification of defects with detailed... [See More]
- System Type: Modular / PC-Based
- Image Source: Optical Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y Stage; Camera Positioner
from KPM Analytics
A compact, ‘plug-and-play ’, full-colour 2D/3D QA Measurement System designed to provide critical measurements accurately, faster and with better repeatability than manual methods, while providing the ability to measure and quantify product attributes that are difficult or impossible to... [See More]
- System Type: Turnkey / Complete System
- Operating System: Windows 10 Professional or Enterprise
- Inspection Rate: 10
- Applications: Food & Beverage
from Phenom-World BV
The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention. The backscattered-electron detector (BSED) and... [See More]
- System Type: Modular / PC-Based
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- Modules Included: Imaging & Analysis Software
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage
from KEYENCE
CV-X100 Series Intuitive Auto-Teaching Machine Vision System. Power Meets Simplicity. Auto-Teach Inspection. Intuitive Programming Interface. Point and Click Geometric Measurement. Auto-Generate Manual. Full vision toolset (including 1D/2D/OCR). Intuitive interface allows users of all levels to... [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based
- Network: Ethernet TCP/IP, EtherNet/IP, PROFINET,PLC-Link, Discrete I/O, Serial
- Inspection Rate: 212
- Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Optical Character Recognition (OCR); Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Tool & Die Monitoring; Web Inspection; Position / Angle
from Phenom-World BV
The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures... [See More]
- System Type: Modular / PC-Based
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- Modules Included: Imaging & Analysis Software
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 0.0050
- Image Source: Electron Microscope
from Phenom-World BV
The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs. The Phenom Pure provides high-quality... [See More]
- System Type: Modular / PC-Based
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- Modules Included: Imaging & Analysis Software
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 5.00E-4
- Image Source: Electron Microscope
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage