Electron Microscope Imaging Workstations
from Phenom-World BV
The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention. The backscattered-electron detector (BSED) and... [See More]
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- System Type: Modular / PC-Based
- Modules Included: Imaging & Analysis Software
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Image Source: Electron Microscope; Signal Tower
- Applications: Electronics or Semiconductor Inspection
- System Type: Turnkey / Complete System
- Stage Type: X-Y-Z Stage
from Phenom-World BV
The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures... [See More]
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- System Type: Modular / PC-Based
- Modules Included: Imaging & Analysis Software
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- System Type: Turnkey / Complete System
- Stage Type: X-Y-Z Stage
from Phenom-World BV
The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs. The Phenom Pure provides high-quality... [See More]
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis
- System Type: Modular / PC-Based
- Modules Included: Imaging & Analysis Software
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- Image Source: Electron Microscope
- Feature Resolution: 0.0050
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- Image Source: Electron Microscope
- Feature Resolution: 0.0050
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- Image Source: Electron Microscope
- Feature Resolution: 5.00E-4
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- Image Source: Electron Microscope
- Feature Resolution: 5.00E-4
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- Image Source: Electron Microscope
- Feature Resolution: 5.00E-4
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- System Type: Turnkey / Complete System
- Stage Type: X-Y-Z Stage
from SemiProbe
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer. [See More]
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- System Type: Turnkey / Complete System
- Stage Type: X-Y-Z Stage