Turnkey / Complete System Imaging Workstations
from KPM Analytics
A compact, ‘plug-and-play ’, full-colour 2D/3D QA Measurement System designed to provide critical measurements accurately, faster and with better repeatability than manual methods, while providing the ability to measure and quantify product attributes that are difficult or impossible to... [See More]
- System Type: Turnkey / Complete System
- Operating System: Windows 10 Professional or Enterprise
- Inspection Rate: 10
- Applications: Food & Beverage
from NorPix, Inc.
StreamPix and TroublePix operate at their best using state of the art StreamPix Station 625 and 1250 computers. These fine tuned computers are assembled in our labs with carefully selected components that will guarantee ultimate performance as well as image recording for hours with a no frame drop... [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based; Turnkey / Complete System
- Mass Storage: 128
- Inspection Rate: 1800
- Operating System: Windows 7
from Nikon Metrology
Auto MeasureEyes is the latest imaging software available for iNEXIV VMA CNC Video Measuring Systems. It enables easy operation for anyone and measurement programs can be created with just a few clicks. Key benefits: Stitching. One-click measurement. Easy programming/reporting functions. Large... [See More]
- System Type: Turnkey / Complete System
- Image Source: Optical Microscope
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage
from NorPix, Inc.
NorPix can provide custom multi-camera recording systems to fit your needs. StreamPix 5. Description. 4 cameras x 60 fps. 4 cameras at 60 fps x 640 x 480 on a single laptop. 4 cameras x 80 fps. Laptop solution at 4 cameras at 80 fps x 640 x 480. 8 cameras x 90 fps. Desktop solution with 8 cameras at... [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based; Turnkey / Complete System
- Mass Storage: 128
- Inspection Rate: 1800
- Operating System: Windows 7
from Nikon Metrology
The VMA-4540V/4540 CNC video measuring system provides a large XYZ stroke and a wide field of view. The touch-probe-ready model VMA-4540 is ideal for a wide variety of industrial measuring applications. The VMA-4540V/4540 is designed for high-accuracy measurement of a variety of work pieces. A wide... [See More]
- System Type: Turnkey / Complete System
- Image Source: Optical Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis; Production & Quality Control
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 0.0050
- Image Source: Electron Microscope
from NorPix, Inc.
For troubleshooting applications requiring multiple cameras. Monitor a single target from various angles. StreamPix4 is compatible with multiple cameras at various speeds and resolutions. Troubleshoot your production line or analyze hardware issues by imaging. View events from multiple angles. [See More]
- System Type: Embedded / Vision Engine; Modular / PC-Based; Turnkey / Complete System
- Mass Storage: 128
- Inspection Rate: 1800
- Operating System: Windows 7
from Nikon Metrology
Magnification, AF and illumination conditions can be finely adjusted for each specimen. VMZ-R6555 offers 650 x 550 mm stroke, which is suitable for large components and "step-and-repeat" measurements of multiple pieces on the stage. Key benefits. Six types of optical zooming head. Detection of 0.1... [See More]
- System Type: Turnkey / Complete System
- Image Source: Optical Microscope
- Applications: Electronics or Semiconductor Inspection; Flaw Detection; Materials Analysis; Production & Quality Control
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 0.0050
- Image Source: Electron Microscope
from Nikon Metrology
It incorporates confocal technology, brightfield with a 15X zoom, and TTL Laser AF. No matter what geometrical measurements you need –two-dimensional or three-dimensional –inspection and evaluation is exceptionally fast and accurate with this system!. The Confocal NEXIV can be optimally... [See More]
- System Type: Turnkey / Complete System
- Image Source: Optical Microscope
- Applications: Electronics or Semiconductor Inspection; Production & Quality Control
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 5.00E-4
- Image Source: Electron Microscope
from SemiProbe
Manual, semiautomatic and fully automatic systems with probing capabilities ranging from individual die to >450 mm wafers/substratesThe Probe System for Life (PS4L) family of wafer probing systems is designed based on SemiProbe ™s patented adaptive architecture. Unlike traditional probe... [See More]
- System Type: Turnkey / Complete System
- Applications: Electronics or Semiconductor Inspection
- Feature Resolution: 5.00E-4
- Image Source: Electron Microscope
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage
from SemiProbe
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer. [See More]
- System Type: Turnkey / Complete System
- Image Source: Electron Microscope
- Applications: Electronics or Semiconductor Inspection
- Stage Type: X-Y-Z Stage