Electrical Test - Parametric / In-line Semiconductor Metrology Instruments
from Cascade Microtech, Inc.
Sub-micron resolution, precise motion control, and 8-inch travel [See More]
- Measurements: Device, gate or circuit electrical testing
- Mounting / Loading: Floor
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Measurements: Defects, dimples or film residues; Device, gate or circuit electrical testing; Particle contamination; Area mapping
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- Measurements: Device, gate or circuit electrical testing
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
The SemiProbe M12 is the most modular and flexible 300 mm manual probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a manual 300... [See More]
- Measurements: Device, gate or circuit electrical testing
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
The SemiProbe M4 is the most modular and flexible 100 mm manual probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a manual 100... [See More]
- Measurements: Device, gate or circuit electrical testing
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
The SemiProbe SA-12 is the most modular and flexible 300 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Measurements: Device, gate or circuit electrical testing
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
The SemiProbe SA-4 is the most modular and flexible 100 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Measurements: Device, gate or circuit electrical testing
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
The SemiProbe SA-6 is the most modular and flexible 150 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Measurements: Device, gate or circuit electrical testing
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- Measurements: Device, gate or circuit electrical testing; Area mapping
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
from SemiProbe
Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer. [See More]
- Measurements: Device, gate or circuit electrical testing; Area mapping
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Technology: Optical / Imaging