Manual Loading Semiconductor Metrology Instruments
from Zygo Corporation
The APM650 ™ packaging metrology system is a new inspection tool for automated measurement of panel-based PCBs and other advanced packaging applications. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral... [See More]
- Mounting / Loading: Manual loading
- Technology: Interferometer
- Form Factor: Monitor or instrument
- Applications: Wafer
from MicroSense, LLC
Benchtop, automated Thickness measurement systems. Cassette to cassette or manual loading. Exclusive sensing technology with dual White light chromatic coding probes (10nm resolution). Wafer 2 ” to 4 ” (50 to 100mm). Thickness range: 50um to 3mm. Throughput up to 100W/hours. 2D & 3D... [See More]
- Mounting / Loading: Manual loading
- Technology: Optical / Imaging
- Form Factor: Monitor or instrument
- Applications: Wafer
from MTI Instruments Inc.
The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII ’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow,... [See More]
- Mounting / Loading: Manual loading
- Technology: Capacitance or electromagnetic gage
- Form Factor: ProbingSystem; Sensor or sensing element
- Applications: Wafer
from Nanotronics Imaging
The Nanotronics Imaging nSpec ® is an inspection device designed for high resolution microscopy and detection of wafer defects. With particular application in silicon carbide and Galium Nitride epi wafers, the nSpec ® offers fast quantification and qualification of defects with detailed... [See More]
- Mounting / Loading: Manual loading
- Technology: Optical / Imaging
- Form Factor: ProbingSystem
- Applications: Wafer
from Phenom-World BV
The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images with a minimum of user maintenance intervention. The backscattered-electron detector (BSED) and... [See More]
- Mounting / Loading: Manual loading
- Technology: FIB
- Form Factor: Monitor or instrument
- Applications: Wafer; CVD / PVD; Packaged IC or substrate
from Cascade Microtech, Inc.
Features high-temperature ceramic low-noise probes [See More]
- Mounting / Loading: Manual loading
- Technology: Optical / Imaging
- Form Factor: ProbingSystem
- Applications: Wafer
from TSI Incorporated
This manually-loaded particle deposition system deposits PSL and SiO2 spheres as small as 10 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high volumes of high-quality custom wafer calibration standards. Manual loading allows a wide range... [See More]
- Mounting / Loading: Manual loading
- Applications: Wafer; CVD / PVD
- Form Factor: Wafer Inspection And Metrology
- Wafer / Part Size: 150 to 300
from Xenemetrix Ltd.
EX-6600 SDD. Secondary Target EDXRF. Xenemetrix ’s EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic noise and higher count rates which translates... [See More]
- Mounting / Loading: Manual loading; Floor
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); EDXRF
- Form Factor: Monitor or instrument
- Applications: Wafer; CVD / PVD; Electroplate
from Hitachi High-Tech America
Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique,... [See More]
- Mounting / Loading: Manual loading
- Technology: X-ray Diffractometer
- Form Factor: Monitor or instrument
- Applications: Wafer; Electroplate
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Mounting / Loading: Manual loading
- Technology: Optical / Imaging
- Form Factor: ProbingSystem
- Applications: Wafer (optional feature)
from MicroSense, LLC
Benchtop automated thickness measurement system with X-Y stage on air bearing for wafers up to 8 ” round and for square wafers up to 156mmx156mm. Dual white light chromatic coding probe technology with 10nm resolution. Thickness range from 50um to 1mm. Automated calibration. Hiscan option for... [See More]
- Mounting / Loading: Manual loading
- Technology: Optical / Imaging
- Form Factor: Monitor or instrument
- Applications: Wafer
from MTI Instruments Inc.
The Proforma 300i wafer thickness gage is a capacitance based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers. By utilizing MTI Push/Pull technology, the Proforma 300i does not require the wafers to have a consistent... [See More]
- Mounting / Loading: Manual loading
- Technology: Capacitance or electromagnetic gage
- Form Factor: ProbingSystem; Sensor or sensing element
- Applications: Wafer
from Phenom-World BV
The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their elemental composition determined. Viewing three-dimensional images of microscopic structures... [See More]
- Mounting / Loading: Manual loading
- Technology: FIB
- Form Factor: Monitor or instrument
- Applications: Wafer; CVD / PVD; Packaged IC or substrate
from Xenemetrix Ltd.
RoHS Vision. The Fast and Easy Method for Ensuring Compliance. with Regulations for Hazardous Substances. The Restriction of Hazardous Substances Directive (RoHS) restricts toxic metals in electrical and electronic equipment. Xenemetrix ’s new RoHS Vision uses a high resolution detector, a... [See More]
- Mounting / Loading: Manual loading; Floor
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); EDXRF
- Form Factor: Monitor or instrument
- Applications: Wafer; CVD / PVD; Electroplate
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- Mounting / Loading: Manual loading
- Technology: Optical / Imaging
- Form Factor: ProbingSystem
- Applications: Wafer (optional feature)
from MicroSense, LLC
Benchtop, Manual Thickness measurement system. Patented sensing technology with APBP (dual automated positioning backpressure probes) (20nm resolution). Samples 2 ” to 12 ” (50 to 300mm). Thickness range: 20um to 5mm. Automated calibration. All materials, all type of surfaces. Options. [See More]
- Mounting / Loading: Manual loading
- Technology: Automated Positioning Backpressure Probe (APBP)
- Form Factor: Monitor or instrument
- Applications: Wafer
from Phenom-World BV
The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure is equipped with the basic fundamentals for meeting imaging needs. The Phenom Pure provides high-quality... [See More]
- Mounting / Loading: Manual loading
- Technology: FIB
- Form Factor: Monitor or instrument
- Applications: Wafer; CVD / PVD; Packaged IC or substrate
from Xenemetrix Ltd.
X-Calibur SDD. Bench Top EDXRF Spectrometer. versatile, high energy resolution. Our X-Calibur SDD EDXRF spectrometer features similar configuration like X-Calibur but with Silicon Drift Detector. Thanks to SDD high count rates the instrument improves its response time thus minimizing down time. The... [See More]
- Mounting / Loading: Manual loading; Floor
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); EDXRF
- Form Factor: Monitor or instrument
- Applications: Wafer; CVD / PVD; Electroplate
from SemiProbe
The SemiProbe M4 is the most modular and flexible 100 mm manual probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a manual 100... [See More]
- Mounting / Loading: Manual loading
- Technology: Optical / Imaging
- Form Factor: ProbingSystem
- Applications: Wafer (optional feature)