Active Components / Semiconductors Automated Test Equipment
Description
Active Components / Semiconductors Automated Test Equipment (ATE) is designed to test and evaluate the performance of semiconductor devices. This equipment automates the testing process, ensuring that semiconductor components meet specified performance criteria by applying various test conditions and measuring responses.
Working Principle
The working principle of semiconductor ATE involves a master controller, typically a computer, that synchronizes multiple sources and capture instruments. The device under test (DUT) is connected to the ATE via a handler or prober, which places the device on a customized interface board. The ATE applies a variety of test conditions, such as different levels of current, voltage, and frequency, to evaluate the device's performance. This setup allows for precise and efficient testing of semiconductor devices, ensuring they meet required specifications and operate as intended .
Applications
Semiconductor ATE is used in various applications, including logic testing for microprocessors, gate arrays, and ASICs. It is also employed in testing power semiconductor devices by applying high voltages and in testing high frequency/radio frequency (HF/RF) devices by applying appropriate waveforms. The Simcenter POWERTESTER 1500A, for example, is used in semiconductor manufacturing environments for analyzing MOSFET, IGBT, and generic two-pole devices .
Advantages over other Automated Test Equipment
One significant advantage of semiconductor ATE, such as the Simcenter POWERTESTER 1500A, is its ability to perform fully automated power testing and cycling without removing the device under test. This capability enhances the speed and efficiency of package development, reliability testing, and batch checking of incoming parts before production .
Limitations
A limitation of some automated test equipment, such as functional automatic test equipment (FATE), is its inability to keep up with the increasing speed of boards, causing a lag between the board under test and the manufacturing process. Additionally, in-circuit testers (ICTs) face challenges due to the high density of tracks and components in modern designs, requiring very accurate placement of contact pins .
Considerations
When considering semiconductor ATE, factors such as initial costs, operating expenses, durability, accuracy, and maintenance costs should be evaluated. The complexity of the equipment and the need for precise testing capabilities can influence these factors. Additionally, the choice of ATE should align with the specific testing requirements of the semiconductor devices being evaluated, ensuring that the equipment can handle the necessary test conditions and provide reliable results .
from Cosmic Equipment SpA
FTI-1000 Flexible is a compact, multi-site ATE configuration designed for high-mix testing of medium-power Si and GaN discrete devices. Suitable for both engineering workflows and automated production, it integrates independent DC and AC resources capable of measuring key MOSFET parameters including... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from ESPEC North America Inc | Qualmark Products and Services
The ESS22/35 Series offers high volume horizontal airflow for rack systems. The chambers can be adapted to many product configurations and provide manual, automatic robotic interface. A variety of methods are available for product power and test interface including auto insertion. Provides fast... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Environmental Stress Test Chamber
- Type / Form: Module, Sub-system or ATE Component; Test Chamber
- Interface: Programmable Controller
from Cosmic Equipment SpA
Next generation power products, particularly wide bandgap (WBG) require more testing while production process parameters and product yield are optimized. M2 Flexible Edition measures static parameters, dynamic switch performance, thermal die attach, gate quality, and stress tests such as avalanche... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from ESPEC North America Inc | Qualmark Products and Services
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Environmental Stress Test Chamber
- Type / Form: Module, Sub-system or ATE Component; Test Chamber
- Interface: Programmable Controller
from Cosmic Equipment SpA
Next generation power products, particularly wide bandgap (WBG) require more testing while production process parameters and product yield are optimized. M2 Turret Edition measures static parameters, dynamic switch performance, thermal die attach, gate quality, and stress tests such as avalanche and... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from ESPEC North America Inc | Qualmark Products and Services
HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100 °C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Highly Accelerated Stress Test Chamber
- Type / Form: Module, Sub-system or ATE Component; Test Chamber
- Interface: Programmable Controller
from Cosmic Equipment SpA
VIP Extended is a highly configurable ATE system designed for parallel testing of silicon-based, SiC, and GaN devices, including high-side/low-side drivers, IGBTs, power MOSFETs, and power ICs. Engineered for use in wafer sort, strip test, pick & place, and gravity handler environments, the system... [See More]
- Component / Product Tested: MEMS or Electromechanical Devices; Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from Cosmic Equipment SpA
The VIP Ultra by Cosmic is a next-generation, ultra-high throughput ATE (Automatic Test Equipment) engineered for power-semiconductor testing-ideal for Si, SiC, GaN discrete devices, power modules, and high-/low-side driver ICs. Designed for cleanroom integration, it delivers exceptional parallel... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from CHINO Works America Inc.
The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. [See More]
- Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components
- Tester / Test Capability: Life or Endurance Test; Functional
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
- Interface: Floating Probe
from inTEST Thermal Solutions
The Temptronic® ThermoSpot family of benchtop direct contact systems provide an efficient source for IC temperature characterization, including high-Watt emitting devices. Highly responsive and reliable, the unit feeds a thermal probe head through a flexible umbilical - without the use of... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Thermal Conditioning of Electronic Boards and Modules
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Features: Temperature Control / Oven
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Parametric
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Interface: Probe Card or Performance Board
from Intepro Systems
Highly accelerated life testing of DUT's, junction temperature measurement [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Life or Endurance Test
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software
- Interface: Probe Card or Performance Board
from inTEST Thermal Solutions
Temptronic ThermoChucks are conductive heating and cooling systems for wafer testing at temperature. Its primary use is for wafer testing in Probe Stations, as well as Laser Trim and Wafer Burn-in. A few specialized applications include Low leakage probing (fA level), and High voltage probing (up to... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Thermal Stability, Wafer Testing
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Features: Temperature Control / Oven
from SemiProbe
The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave... [See More]
- Component / Product Tested: Semiconductors or Active Components; DC, HF/Microwave
- Tester / Test Capability: Parametric
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Interface: Probe Card or Performance Board
from inTEST Thermal Solutions
Temptronic's ThermoStreams are portable systems that deliver clean dry air for precision temperature testing or conditioning of electronics (ICs, MEMS, transceivers, or circuits) and materials. No other systems can bring your test subjects to temperature faster with precise control. With rapid... [See More]
- Component / Product Tested: Optoelectronics; Semiconductors or Active Components; Telematics / Automotive
- Tester / Test Capability: Thermal Conditioning, Packaged Parts Testing
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Features: Temperature Control / Oven
from SemiProbe
The SemiProbe SA-12 is the most modular and flexible 300 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Tester / Test Capability: Parametric
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Interface: Probe Card or Performance Board
from inTEST Thermal Solutions
The ECO Series is an environmentally friendly Temptronic® ThermoStream® temperature forcing system that uses less energy with ECO series thermal test system very low audible noise. The temperature test system operates on a low, 20-amp circuit and incorporates the company's proprietary technology... [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Thermal Conditioning of Electronic Boards and Modules
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Features: Temperature Control / Oven
from SemiProbe
The SemiProbe SA-4 is the most modular and flexible 100 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Tester / Test Capability: Parametric
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Interface: Probe Card or Performance Board
from SemiProbe
The SemiProbe SA-6 is the most modular and flexible 150 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Tester / Test Capability: Parametric
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Interface: Probe Card or Performance Board
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- Component / Product Tested: Semiconductors or Active Components
- Tester / Test Capability: Parametric
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Interface: Probe Card or Performance Board