Handler / Prober Automated Test Equipment
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: Semiconductors or Active Components
- Interface: Probe Card or Performance Board
from SemiProbe
The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: Semiconductors or Active Components; DC, HF/Microwave
- Interface: Probe Card or Performance Board
from SemiProbe
The SemiProbe SA-12 is the most modular and flexible 300 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Interface: Probe Card or Performance Board
from SemiProbe
The SemiProbe SA-4 is the most modular and flexible 100 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Interface: Probe Card or Performance Board
from SemiProbe
The SemiProbe SA-6 is the most modular and flexible 150 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Interface: Probe Card or Performance Board
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: Semiconductors or Active Components
- Interface: Probe Card or Performance Board