Test Platform / System Automated Test Equipment
from Konica Minolta Sensing Americas, Inc.
The Area Color Inspection System (ACIS ™) is an integrated solution for efficient inspection of characters and color on surfaces such as metal or plastic. Users can quickly measure markings such as pattern, text, symbols, and color with near-spectrometer accuracy at production speeds. A... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from Cosmic Equipment SpA
The DMT from Cosmic is a compact, mixed-signal and digital automatic test equipment (ATE) designed for efficient IC validation. Thanks to its ultra-high hardware integration, it delivers more resources than larger testers while occupying the lowest footprint on the market. A key feature is Kronos,... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from AMETEK Programmable Power
The Energy Absorber Test System includes power supplies and a regenerative energy absorber with a rating of 400VDC at ±150A. The system consists of DC power supplies, an AC distribution and interlock system, an energy absorber chassis and an absorber load resistor chassis. The power sources are... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from Konica Minolta Sensing Americas, Inc.
Fast, Accurate, Cost-effective View Angle Performance Measurement Solution for Flat Panel Displays. The Radiant Vision Systems FPD (flat panel display) Conoscope Lens enables high-resolution photopic measurement of the angular distribution of color, luminance, and contrast of displays and display... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Displays, Video or Vision Equipment
from Cosmic Equipment SpA
FTI-1000 Flexible is a compact, multi-site ATE configuration designed for high-mix testing of medium-power Si and GaN discrete devices. Suitable for both engineering workflows and automated production, it integrates independent DC and AC resources capable of measuring key MOSFET parameters including... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Semiconductors or Active Components
from AMETEK Programmable Power
The Elgar Power Special Test Equipment (PSTE) provides programmable DC power, and programmable loading, to the electrical systems of satellites for system functional testing. There are several key benefits of the PSTE. First, it is a complete turnkey system that is capable of operating locally... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: Functional
from Konica Minolta Sensing Americas, Inc.
Evaluation tool kit specific to US and ECE headlamp standards. Today's headlights include smart illumination, adaptive systems like matrix LED- or laser-based systems, and other technology that dynamically illuminates roadways while meeting the requirements of national safety regulations. Because... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Displays, Video or Vision Equipment
from Cosmic Equipment SpA
The Hatina 4S by Cosmic is a compact, highly versatile ATE (Automatic Test Equipment) platform specifically designed for final test and WS of MEMS devices in high-volume production. Thanks to its modular architecture, it supports stimulus systems for humidity, pressure, and temperature sensors,... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: MEMS or Electromechanical Devices
from AMETEK Programmable Power
Industry: space power. Application: power bus. Function: Provides sequenced programmable power to a phased array radar test facility. Features: Total power subsystem integration. Total power subsystem integration. Power sequencing. Elapsed time indication. EMO function. Custom rear output panel [See More]
- Type / Form: Platform or Turnkey System
- Tester / Test Capability: Emulation
from Konica Minolta Sensing Americas, Inc.
Turnkey system for automated visual inspection of illuminated keyboards and keypads. Illuminated keyboards and keypads can exhibit variations in brightness and color from key to key, and even within keys, that are noticeable to the end-user, and which detracts from their experience with the product. [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: X-ray; Luminance, Chromaticity
- Component / Product Tested: Keyboard
from Cosmic Equipment SpA
HATINA GP is a general-purpose ATE system developed by Cosmic for high-parallelism testing of ASICs, PMICs, and Smart Power ICs/SoCs. Designed for both wafer-level and packaged device applications, the system integrates modular resources for DC testing, digital signals, and complex measurements. Its... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Logic ICs
from AMETEK Programmable Power
Features. Bus simulator includes BPMU and SPU. Provides enhanced measurement and data-logging of up to 40 channels. Bus Power Monitoring Unit (BPMU) can be easily relocated to TVAC chamber to ease cabling complications. Data can be viewed either in spreadsheet or graphical format. Spacecraft... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from Konica Minolta Sensing Americas, Inc.
ProSource ®enables optical system designers to fully exploit Radiant Source Model ™ files (RSMs) of light sources and lighting systems. RSMs are the most accurate method for describing the near-field output of real light sources in optical and illumination design software because they... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Displays, Video or Vision Equipment
from Cosmic Equipment SpA
Next generation power products, particularly wide bandgap (WBG) require more testing while production process parameters and product yield are optimized. M2 Flexible Edition measures static parameters, dynamic switch performance, thermal die attach, gate quality, and stress tests such as avalanche... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Semiconductors or Active Components
from AMETEK Programmable Power
The CTS Series is a complete, turn-key compliance test system for EN IEC 61000-3-2 (Harmonics), EN IEC 61000-3-3 (Flicker), and various EN IEC 61000-4 AC immunity tests. Consisting of an AC power source, a power analysis conditioning system (PACS), and a PC-based data acquisition system, the IEC... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from Konica Minolta Sensing Americas, Inc.
Complete analysis system for characterizing display mura in terms of human visual perception. Radiant Vision Systems TrueMURA ™ Analysis Module is the first commercial system available to provide advanced image analysis algorithms for computing JND ("Just Noticeable Differences"). This... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Displays, Video or Vision Equipment
from Cosmic Equipment SpA
Next generation power products, particularly wide bandgap (WBG) require more testing while production process parameters and product yield are optimized. M2 Turret Edition measures static parameters, dynamic switch performance, thermal die attach, gate quality, and stress tests such as avalanche and... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Semiconductors or Active Components
from Konica Minolta Sensing Americas, Inc.
Quality testing and defect detection. When testing the quality of illuminated components and displays, or looking for defects in assemblies and surfaces, multiple tests may need to be performed to inspect products for a range of evaluation criteria. TrueTest ™ Software equips ProMetric ®... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: X-ray; Luminance, Chromaticity
- Component / Product Tested: Displays, Video or Vision Equipment; Backlight
from Cosmic Equipment SpA
VIP Extended is a highly configurable ATE system designed for parallel testing of silicon-based, SiC, and GaN devices, including high-side/low-side drivers, IGBTs, power MOSFETs, and power ICs. Engineered for use in wafer sort, strip test, pick & place, and gravity handler environments, the system... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: MEMS or Electromechanical Devices; Semiconductors or Active Components
from Cosmic Equipment SpA
The VIP Ultra by Cosmic is a next-generation, ultra-high throughput ATE (Automatic Test Equipment) engineered for power-semiconductor testing-ideal for Si, SiC, GaN discrete devices, power modules, and high-/low-side driver ICs. Designed for cleanroom integration, it delivers exceptional parallel... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: Semiconductors or Active Components
from CHINO Works America Inc.
The equipment is a full automatic compressor performance testing equipment for measurement of refrigerating capacity of compressors for vehicle-installed air-conditioners. [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
- Tester / Test Capability: Functional
- Component / Product Tested: Compressor
- Features: Temperature Control / Oven; OCR Measurement
from VJ Technologies, Inc.
VJ Inspection Systems' C-Arm X-ray system provides a universal, reliable, and versatile imaging system. Using digital image intensifier or recent-generation flat-panel technology, parts and assemblies may be scanned using an externally loaded, programmable material handling and image processing... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: Manufacturing Defect Analyzer; X-ray
- Component / Product Tested: Parts and Assembly Inspection
- Features: SPC
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: Semiconductors or Active Components
- Interface: Probe Card or Performance Board
from GOEPEL Electronics
Highest inspection speed. ·large, congruent field of view for all cameras. ·high positioning speeds and shortest image acquisition time. Maximum error detection. ·excellent image quality of the orthogonal and angled-view cameras. ·unique multi-spectral and... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
from Intepro Systems
Intepro 9000 is the next generation power supply test. system from Intepro. It is fast, accurate and will cut. your test times dramatically. The modular system has. a high degree of flexibility and is capable of being. configured into highly economic systems for advanced. power electronic test. [See More]
- Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: Functional
- Component / Product Tested: Power Supplies or Transformers
- Interface: Probe Card or Performance Board
from JFW Industries, Inc.
Whether you are fading multiple base station signals to a handset or testing multiple communication standards with wireless devices, JFW has a handover test system to help automate your RF testing. JFW ’s full fan-out handover test systems are a type of matrix switch that is constructed with... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: RF & Microwave
from Safran Electrical & Power
Labinal Power Systems has integration, test and certification benches used for specific electrical equipment but also complete systems. B525. Labinal Power Systems created the B525 integration bench in 2014 to accompany the Bell Helicopter contract for which we provide the full electrical system. [See More]
- Type / Form: Platform or Turnkey System
- Component / Product Tested: Avionics or Military Electronics
from Signalysis, Inc.
The Signalysis Automated Test Manager organizes test requests into one compact program allowing users to perform multiple unattended tests. SigATM provides strict compliance to appropriate test standards while allowing easy access to all acquired data. SigATM can control every aspect of a test with... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: Functional
from CHINO Works America Inc.
The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
- Tester / Test Capability: Life or Endurance Test; Functional
- Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components
- Interface: Floating Probe
from VJ Technologies, Inc.
A major inspection challenge facing the boiler industries is to examine welds in tubing and plate during the manufacturing, erection, and start-up stages. In the steam generation business, billions are lost annually due to downtime caused by leaks in a plant's boiler tubes that is in commercial... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: X-ray
- Component / Product Tested: Pipe and Welding
- Features: SPC
from SemiProbe
The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: Semiconductors or Active Components; DC, HF/Microwave
- Interface: Probe Card or Performance Board
from Intepro Systems
Energy Recycling Air Cooled AC & DC Loads. Intepro's electronic loads are ideal where high power bulk loading is required for burn-in and characterisation applications within Telecommunication and Aerospace sectors, Intepro ’s environmental stress screening (ESS)/Burn-in solutions... [See More]
- Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: Life or Endurance Test
- Component / Product Tested: Power Supplies or Transformers; Networking or Communications Equipment
- Features: Burn-In or Temperature Control; I-V
from JFW Industries, Inc.
Our full fan-out transceiver test system is constructed as a fully meshed matrix. This construction is ideal for testing radio-to-radio communication for an environmental simulation or testing handset-to-handset communication over a wireless network. Block diagrams for each model are listed in the... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: RF & Microwave
from Signalysis, Inc.
IQC is a production line test system from Signalysis, Inc., that provides automatic assembly line Pass/Fail of products based on mechanical vibration characteristics, analysis of functional electrical signals, and other measured and computed quantities. Pass/fail status may be determined from a... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: Functional
from VJ Technologies, Inc.
VJT's pipeline inspection crawler brings together over 20 years of specialized skills and leading-edge technologies to create a revolutionary new real-time pipeline inspection unit. [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: X-ray
- Component / Product Tested: Pipeline
- Features: SPC
from SemiProbe
The SemiProbe SA-12 is the most modular and flexible 300 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Interface: Probe Card or Performance Board
from JFW Industries, Inc.
Whether you are fading multiple base station signals to a handset or testing multiple communication standards with wireless devices, JFW has a handover test system to help automate your RF testing. JFW ’s limited fan-out configuration (LC) handover test systems are scaled down versions of our... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: RF & Microwave
from Signalysis, Inc.
A Microsoft Windows 95/98 (TM) based application, SLAM integrates continuous monitoring with live displays of sound level trends, level indicator bars and numeric output, storing results in an easily accessible database. A Remote Alarm Indicator can be activated from any of the permanent monitoring... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: Functional
from VJ Technologies, Inc.
VJ Inspection Systems T-conveyor x-ray inspection systems deliver unparalleled robustness and high contrast images at competitive pricing. [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: Manufacturing Defect Analyzer; X-ray
- Component / Product Tested: Parts on a Conveyor System
- Features: SPC
from SemiProbe
The SemiProbe SA-4 is the most modular and flexible 100 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Interface: Probe Card or Performance Board
from JFW Industries, Inc.
Our limited fan-out transceiver test systems are constructed as a star matrix with all ports connected through a central hub. The hub allows a transmission from one port to be received at all other ports. This construction type can be used for simulating radio-to-radio or handset-to-handset... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Component / Product Tested: RF & Microwave
from VJ Technologies, Inc.
Our Vertex Series-A is a versatile, all purpose X-Ray system with a new modular design based on solid SRT engineering and offering a 20" x 24" Inspection area with 100% coverage. [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: Manufacturing Defect Analyzer; X-ray
- Component / Product Tested: BareBoard; Loaded PCBs; Electronic Components and Assemblies
- Features: SPC
from SemiProbe
The SemiProbe SA-6 is the most modular and flexible 150 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Interface: Probe Card or Performance Board
from VJ Technologies, Inc.
The VJ Electronix Vertex Series-CT is a dedicated Computed Tomography X-Ray system designed to provide the high accuracy and reliability required to perform 3D analysis of the inner structure of any specimen while still capable of the highest quality 2D inspection. [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: Manufacturing Defect Analyzer; X-ray
- Component / Product Tested: Electronic Components and Assemblies
- Features: SPC
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
- Component / Product Tested: Semiconductors or Active Components
- Interface: Probe Card or Performance Board
from VJ Technologies, Inc.
VJ Inspection Systems 4000 wheel inspection system images cast aluminum wheels in a single rotation. Operators receive a concise, accurate wheel discontinuity picture allowing optimized process adjustment. The wheel inspection system incorporates next generation linear diode array (LDA) imaging... [See More]
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit
- Tester / Test Capability: Manufacturing Defect Analyzer; X-ray
- Component / Product Tested: Telematics / Automotive; Cast Aluminum Wheel Discontinuity
- Features: SPC