Test Module / Sub-system Automated Test Equipment
from Konica Minolta Sensing Americas, Inc.
Specially-designed lens option for near-eye display testing within augmented and virtual reality headsets. The AR/VR Lens has a unique optical design specially engineered for measuring near-eye displays (NEDs), such as those integrated into virtual (VR), mixed (MR), and augmented reality (AR)... [See More]
- Type / Form: Module, Sub-system or ATE Component
- Tester / Test Capability: X-ray; Luminance, Chromaticity
- Component / Product Tested: Displays, Video or Vision Equipment; Augmented and Virtual Reality Displays
from ESPEC North America Inc | Qualmark Products and Services
The ESS22/35 Series offers high volume horizontal airflow for rack systems. The chambers can be adapted to many product configurations and provide manual, automatic robotic interface. A variety of methods are available for product power and test interface including auto insertion. Provides fast... [See More]
- Type / Form: Module, Sub-system or ATE Component; Test Chamber
- Tester / Test Capability: Environmental Stress Test Chamber
- Component / Product Tested: Semiconductors or Active Components
- Interface: Programmable Controller
from Konica Minolta Sensing Americas, Inc.
Specially-designed lens option for high-resolution imaging of small light source and display features. The Radiant Vision Systems Microscope Lens enables high-resolution imaging of extremely small components and features, such as individual LEDs, display pixels, and subpixels. The lens attaches... [See More]
- Type / Form: Module, Sub-system or ATE Component
- Tester / Test Capability: X-ray
- Component / Product Tested: Displays, Video or Vision Equipment
from ESPEC North America Inc | Qualmark Products and Services
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of... [See More]
- Type / Form: Module, Sub-system or ATE Component; Test Chamber
- Tester / Test Capability: Environmental Stress Test Chamber
- Component / Product Tested: Semiconductors or Active Components
- Interface: Programmable Controller
from Konica Minolta Sensing Americas, Inc.
Fast, accurate radiant intensity measurement solution for evaluation of near-infrared light sources and distributions. Near-Infrared Intensity Lens Solution. The Radiant Vision Systems Near-Infrared (NIR) Intensity Lens system is an integrated camera/lens solution that measures the angular... [See More]
- Type / Form: Module, Sub-system or ATE Component
- Tester / Test Capability: Near-IR Angular Emission Measurement
from ESPEC North America Inc | Qualmark Products and Services
HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100 °C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be... [See More]
- Type / Form: Module, Sub-system or ATE Component; Test Chamber
- Tester / Test Capability: Highly Accelerated Stress Test Chamber
- Component / Product Tested: Semiconductors or Active Components
- Interface: Programmable Controller
from Konica Minolta Sensing Americas, Inc.
Imaging Colorimeter with Integrated Spectrometer. The ProMetric ® I-SC Solution combines the functions of an enhanced ProMetric I Imaging Colorimeter with a high-end spectrometer to provide a single platform for spectral data capture and accurate, repeatable color measurement across devices,... [See More]
- Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
- Tester / Test Capability: Uniformity Testing, R&D Settings,Production Line Testing, Display Testing, Color Correction
from Konica Minolta Sensing Americas, Inc.
The World's Fastest and Most Accurate High-Resolution Imaging Colorimeters. ProMetric® I imaging colorimeters are designed to address the demands for high-volume manufacturing of displays, backlit components, light sources, and device components. Applying tristimulus color filter technology based on... [See More]
- Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
- Component / Product Tested: Displays, Video or Vision Equipment
from inTEST Thermal Solutions
The Temptronic® ThermoSpot family of benchtop direct contact systems provide an efficient source for IC temperature characterization, including high-Watt emitting devices. Highly responsive and reliable, the unit feeds a thermal probe head through a flexible umbilical - without the use of... [See More]
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Tester / Test Capability: Thermal Conditioning of Electronic Boards and Modules
- Component / Product Tested: Semiconductors or Active Components
- Features: Temperature Control / Oven
from Artifex Engineering
The LIV100 is a powerful pulsed current test system for use in the lab as well as for OEM applications, ideal for. Diode characterization at the chip or bar level. Quality control of incoming goods. OEM. We offer this instrument with a variety of end stages covering current ranges from 1A up to... [See More]
- Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
- Component / Product Tested: Laser Diodes
from OMICRON electronics Corp. USA
Partial discharge (PD) phenomena is evidence of a degrading insulation capacity. As partial discharge often precedes an insulation breakdown of high voltage equipment, its detection and monitoring is of vital importance. The pioneers of multi-channel synchronous PD systems, mtronix, teamed up with... [See More]
- Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; CAD Interface, Database, Test Program Generator or Other Test Software (optional feature)
- Tester / Test Capability: Partial Discharge Analysis
- Component / Product Tested: Power Supplies or Transformers; Generators
from JTAG Technologies Inc.
Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry's most reliable IEEE 1149.x controllers, specifically designed by us for high throughput and the best signal integrity. High-speed DataBlaster controllers are... [See More]
- Type / Form: Module, Sub-system or ATE Component
- Component / Product Tested: BareBoard; Loaded PCBs
from inTEST Thermal Solutions
Temptronic ThermoChucks are conductive heating and cooling systems for wafer testing at temperature. Its primary use is for wafer testing in Probe Stations, as well as Laser Trim and Wafer Burn-in. A few specialized applications include Low leakage probing (fA level), and High voltage probing (up to... [See More]
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Tester / Test Capability: Thermal Stability, Wafer Testing
- Component / Product Tested: Semiconductors or Active Components
- Features: Temperature Control / Oven
from inTEST Thermal Solutions
Temptronic's ThermoStreams are portable systems that deliver clean dry air for precision temperature testing or conditioning of electronics (ICs, MEMS, transceivers, or circuits) and materials. No other systems can bring your test subjects to temperature faster with precise control. With rapid... [See More]
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Tester / Test Capability: Thermal Conditioning, Packaged Parts Testing
- Component / Product Tested: Optoelectronics; Semiconductors or Active Components; Telematics / Automotive
- Features: Temperature Control / Oven
from inTEST Thermal Solutions
The ECO Series is an environmentally friendly Temptronic® ThermoStream® temperature forcing system that uses less energy with ECO series thermal test system very low audible noise. The temperature test system operates on a low, 20-amp circuit and incorporates the company's proprietary technology... [See More]
- Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
- Tester / Test Capability: Thermal Conditioning of Electronic Boards and Modules
- Component / Product Tested: Semiconductors or Active Components
- Features: Temperature Control / Oven