Performance Board / Probe Card Automated Test Equipment
from Intepro Systems
Intepro 9000 is the next generation power supply test. system from Intepro. It is fast, accurate and will cut. your test times dramatically. The modular system has. a high degree of flexibility and is capable of being. configured into highly economic systems for advanced. power electronic test. [See More]
- Interface: Probe Card or Performance Board
- Component / Product Tested: Power Supplies or Transformers
- Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: Functional
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Interface: Probe Card or Performance Board
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
from SemiProbe
The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave... [See More]
- Interface: Probe Card or Performance Board
- Component / Product Tested: Semiconductors or Active Components; DC, HF/Microwave
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
from SemiProbe
The SemiProbe SA-12 is the most modular and flexible 300 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Interface: Probe Card or Performance Board
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
from SemiProbe
The SemiProbe SA-4 is the most modular and flexible 100 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Interface: Probe Card or Performance Board
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
from SemiProbe
The SemiProbe SA-6 is the most modular and flexible 150 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Interface: Probe Card or Performance Board
- Component / Product Tested: MEMS or Electromechanical Devices; Optoelectronics; Semiconductors or Active Components; HF/Microwave, Device Characterization, Photovoltaic, Falure Analysis
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric
from SemiProbe
SA-8VP Semiautomatic Vacuum Probing System. The ONLY vacuum probing system designed to grow with your requirements and your business. Easily customized to meet a variety of applications and budgets. Ideal for MEMS, Sensors, Switches, Microbolometers, or any product that is vacuum-packaged. [See More]
- Interface: Probe Card or Performance Board
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
- Tester / Test Capability: Parametric