Semiconductor Metrology Instruments - Spectral Interference Laser Displacement Meter -- SI-F01
from KEYENCE

SI-F Series Spectral Interference Displacement Meter. The SI-F Series Spectral Interference Displacement Meter specializes in super-high accuracy displacement measurement for thickness or position measurement or surface mapping. With resolution down to 1nm, the SI Series is able to see even the... [See More]

  • Applications: Wafer; Packaged IC or substrate
  • Mounting / Loading: In-line; Floor
  • Form Factor: Monitor or instrument; Controller; Sensor or sensing element
  • Technology: Interferometer
ICOS Component Inspection System -- CI-3050
from KLA-Tencor Corporation

The CI-3050 Component Inspection System offers high-quality, 2D and 3D inspection of small lots and QA samples. The CI-3050 is the smallest automatic component inspection system available, and with its small footprint and easy operation, the CI-3050 Component Inspection System is offers unmatched... [See More]

  • Applications: Packaged IC or substrate
  • Mounting / Loading: Floor
  • Form Factor: Component Inspection System
  • Technology: Optical / Imaging
Laser Diode Bar Tester
from TELOPS, Inc.

The laser diode bar tester picks up each laser diode bar from the tape and measures LIV, wavelength and FFP characteristics for each die. [See More]

  • Applications: Packaged IC or substrate; Laser Diode Bar Tester
  • Mounting / Loading: Floor
  • Form Factor: Monitor or instrument; ProbingSystem
  • Technology: Optical / Imaging; IV system or SMU; Wafer sorter or prober
Laser Machining Microscope -- MIC4
from WDI Wise Device Inc.

This is the only commercially available microscope guaranteeing transmission of more then 80% for all four YAG laser harmonics: 266, 355, 532, and 1064nm - without compromising the review channel fidelity. The MIC4 microscope is instrumental in laser repair of TFT arrays over the wavelength ranging... [See More]

  • Applications: CVD / PVD; Electroplate; Packaged IC or substrate; Photolithography; PV Cell, Laser Micromachining, Photomask
  • Mounting / Loading: Floor (optional feature)
  • Form Factor: Monitor or instrument
  • Technology: Optical / Imaging
NewView 7200 -- 3D Optical Profiling System
from Zygo Corporation

Excellent precision and accuracy [See More]

  • Applications: Wafer; Packaged IC or substrate; Surface Topography, Micromachining
  • Mounting / Loading: Manual loading
  • Form Factor: Monitor or instrument
  • Technology: Profilometer or AFM; Optical / Imaging; Interferometer