from MTI Instruments Inc.
The Proforma 200SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 75 to 200 mm. wafers, the 200SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around... [See More]
- Form Factor: ProbingSystem; Sensor or sensing element
- Technology: Capacitance or electromagnetic gage
- Mounting / Loading: Manual loading
- Applications: Wafer
from Cascade Microtech, Inc.
Features high-temperature ceramic low-noise probes [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Applications: Wafer
from Hitachi High Technologies America, Inc.
The FB2200 allows for rapid and precise specimen preparation for both transmission and scanning electron microscopy of semiconductors and other advanced materials. High precision and high milling rates. The use of a new low aberration ion optical system allows a maximum beam current of 60nA at an... [See More]
- Form Factor: ProbingSystem
- Technology: FIB
- Mounting / Loading: Floor
- Applications: Wafer; CVD / PVD
from KLA-Tencor Corporation
Suitable for detecting a wide variety of defects in the sub-micron to five-micron range, the 8900 is the fastest of all KLA-Tencor patterned-wafer defect inspection systems. Based on the production-proven Puma platform, the 8900 enables cost-effective inspection of 200mm or 300mm wafers from initial... [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Floor
- Applications: Photolithography
from Nikon Metrology, Inc.
The AMI-3000 automatic macro inspection system brings together all of Nikon's expertise in semiconductor manufacturing to enhance macro inspection precision, providing quantified reference criteria and enabling more efficient process management. [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Floor
- Applications: Wafer
from TELOPS, Inc.
The laser diode bar tester picks up each laser diode bar from the tape and measures LIV, wavelength and FFP characteristics for each die. [See More]
- Form Factor: Monitor or instrument; ProbingSystem
- Technology: Optical / Imaging; IV system or SMU; Wafer sorter or prober
- Mounting / Loading: Floor
- Applications: Packaged IC or substrate; Laser Diode Bar Tester
