Low Power Methodology Manual: For System-on-Chip Design

11.8: Power Analysis

11.8 Power Analysis

Having completed the implementation of our multi-voltage, power gated design, it is now necessary to verify the integrity of the power network. Two aspects of our power network are critical: the voltage drop seen by the standard cells in the power gated blocks and the profile of the in-rush current during power-up sequencing.

Performing power rail analysis of the design is critical. There will be many power rails in the design and the integrity of each needs verifying and the interaction between rails (coupling) also needs to be verified. Using a comprehensive rail analysis tool, we can perform extensive analysis of the power networks in the design. The coarse level power network analysis was completed during the power planning phase. What we are looking for here are areas in the design where we have excessive voltage drop due to local level clustering which results in power "hot" spots.

Implementation tools today are very good at performing local clustering of registers, clock gates and clock tree buffers to ensure that aggressive timing goals are met. This however can make the voltage drop problem worse in those regions of the chip, especially in regions with switched power rails. Since logic spreading in these areas is not viable (this will impact the QoR) we must deal with the voltage drop problem in a different manner and typically sizing the switch cells and power mesh is the best approach.

The rail analysis gives us valuable data on the voltage drop seen...

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