Low Power Methodology Manual: For System-on-Chip Design

For those designs that require fast resumption of operation after wakeup, it is necessary to save the current state of a design before going into sleep mode and to restore the state at wakeup. In this chapter, we describe on-chip retention methods, including retention registers and retention techniques for memory.
There are a number of different retention register designs. The ones we discuss here are all variations of a standard scan-testable D-type flip-flop. We describe three kings of retention registers:
Single Pin Live Slave uses a single save/restore control pin with minimal changes to the flop itself
Single Pin Balloon uses a single save/restore control pin but adds a second slave latch for retention
Dual Pin Balloon uses separate save and restore control pins and a second slave latch for retention
The simplest form of retention register is one in which the underlying master-slave latch structure is adapted to provide a low-leakage mode to maintain the state of the slave latch.
Figure 13-1 shows the conceptual adaptation of the rising-edge clocked scan-register design.
The front-end of the register is a multiplexer. When the scan-enable control "SE" is de-asserted it selects the functional data "D" input; when SE is asserted it selects the scan chain serial input "SI." To provide best setup timing behavior this mux and much of the data path use Low-V T transistors indicated in the drawing...