[Abramovici 1994] M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design, Revised Printing, IEEE Press, Piscataway,NJ, 1994.

[Bushnell 2000] M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits, Springer, Boston, 2000.

[Dally 1998] W. J. Dally and J. W. Poulton, Digital Systems Engineering, Cambridge University Press, London, 1998.

[Gizopoulos 2006] D. Gizopoulos, editor, Advances in Electronic Testing: Challenges and Methodologies Series: Frontiers in Electronic Testing, Springer, Boston, 2006.

[Jha 2003] N. Jha and S. Gupta, Testing of Digital Systems, Cambridge University Press, London, 2003.

[Lala 2001] P. K. Lala, Self-Checking and Fault-Tolerant Digital Design, Morgan Kaufmann, San Francisco, 2001.

[Mourad 2000] S. Mourad and Y. Zorian, Principles of Testing Electronic Systems, John Wiley & Sons, Somerset,NJ, 2000.

[Nicolici 2003] N. Nicolici and B. Al-Hashimi, Power-Constrained Testing of VLSI Circuits, Kluwer Academic, Norwell,MA, 2003.

[Peterson 1972] W. W. Peterson and E. J. Weldon, Jr., Error-Correcting Codes, MIT Press, Cambridge,MA, 1972.

[Pradhan 1996] D. K. Pradhan, Fault-Tolerant Computer System Design, Prentice Hall, Upper Saddle River,NJ, 1996.

[Rabaey 1996] J. Rabaey, Digital Integrated Circuits, Prentice Hall, Upper Saddle River,NJ, 1996.

[Senthinatharr 1994] R. Senthinatharr and J. L. Prince, Simultaneous Switching Noise of CMOS Devices and Systems, Kluwer Academic, Norwell,MA, 1994.

[Siewiorek 1998] D. Siewiorek and R. S. Swarz, Reliable Computer...