Optical Constants (n, k) Wafer and Thin Film Instrumentation
from Filmetrics, Inc.
Turn Your Microscope into a Film Thickness Measurement Tool. The F40 product family is for applications that require a spot size as small as 1 micron. For most microscopes the F40 simply attaches to the c-mount adapter, which is the industry standard for video camera mounting. The F40 comes complete... [See More]
- Measurements: Optical constants (n or k)
- Mounting / Loading: In-process, in-situ or system mounted
- Form Factor: Monitor or instrument
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); Spectral Reflectance
from Filmetrics, Inc.
Boost the Capabilities and Extend the Life of Your NanoSpec ™ 180/210 System. Your NanoSpec ™ has been a workhorse for your fab, but many years of use may have caused maintenance costs to balloon. The F40-NSR converts your NanoSpec ™ 180/210 into a modern-day measurement instrument... [See More]
- Measurements: Optical constants (n or k)
- Mounting / Loading: In-process, in-situ or system mounted
- Form Factor: Monitor or instrument
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); Spectral Reflectance
from Filmetrics, Inc.
Measure Films as Thin as 4nm. The F40-UV can be configured to measure films as thin as 4nm on a spot size as small as 7 microns. It comes complete with its own UV microscope and integrated color video camera that allows exact monitoring of the film thickness measurement spot. Thickness and index can... [See More]
- Measurements: Optical constants (n or k)
- Mounting / Loading: In-process, in-situ or system mounted
- Form Factor: Monitor or instrument
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); Spectral Reflectance
from Filmetrics, Inc.
High-Resolution Film Thickness Maps. The Filmetrics F42 can map the thickness of films, such as OSP, at over one-million points, each with a spot size as small as 3 microns. Using an integrated CCD camera, live video makes it easy to pinpoint exact measurement locations. Once the feature is in the... [See More]
- Measurements: Optical constants (n or k); Area mapping
- Mounting / Loading: In-process, in-situ or system mounted
- Form Factor: Monitor or instrument
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); Spectral Reflectance
from Filmetrics, Inc.
The Most Powerful Tool Available for Monitoring Thin-Film Deposition. Measure deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the F30 spectral reflectance system. Example Layers. MBE and MOCVD: Smooth and... [See More]
- Measurements: Deposition rate; Optical constants (n or k); FilmThickness
- Mounting / Loading: In-line
- Form Factor: Monitor or instrument
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); Spectral Reflectance