Capacitance / EM Gage Wafer and Thin Film Instrumentation
2 Results
Semi-Automated Wafer Measurement System -- Proforma™ 300SA
from MTI Instruments Inc.
from MTI Instruments Inc.
The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII ’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow,... [See More]
- Technology: Capacitance or electromagnetic gage
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem; Sensor or sensing element
- Applications: Wafer
Semiconductor Metrology System -- Proforma™ 300Gi
from MTI Instruments Inc.
from MTI Instruments Inc.
The Proforma 300i wafer thickness gage is a capacitance based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers. By utilizing MTI Push/Pull technology, the Proforma 300i does not require the wafers to have a consistent... [See More]
- Technology: Capacitance or electromagnetic gage
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem; Sensor or sensing element
- Applications: Wafer