Optical / Imaging System Wafer and Thin Film Instrumentation
from Daitron Co., Ltd.
The visual inspection machines capture high-definition images of semiconductor products and transparent objects such as glass and perform the measurements for scratches, particulates and debris, chipping, color unevenness, dimensions of devices and so forth through the image processing technology. [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Floor
- Form Factor: Monitor or instrument
- Applications: Wafer
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Applications: Wafer (optional feature)
from Nanotronics Imaging
The Nanotronics Imaging nSpec ® is an inspection device designed for high resolution microscopy and detection of wafer defects. With particular application in silicon carbide and Galium Nitride epi wafers, the nSpec ® offers fast quantification and qualification of defects with detailed... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Applications: Wafer
from MicroSense, LLC
Benchtop, automated Thickness measurement systems. Cassette to cassette or manual loading. Exclusive sensing technology with dual White light chromatic coding probes (10nm resolution). Wafer 2 ” to 4 ” (50 to 100mm). Thickness range: 50um to 3mm. Throughput up to 100W/hours. 2D & 3D... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Form Factor: Monitor or instrument
- Applications: Wafer
from Polytec, Inc.
For the best yields it is necessary to optimize your process. Measuring and understanding the characteristicsof your product allows continuous improvement. The AVT-1000 enables you to measure all critical parame-ters on metal or glass such as Roughness, Waviness, and Defects. The AVT can measure... [See More]
- Technology: Optical / Imaging; Laser Doppler Vibrometry
- Mounting / Loading: Floor
- Form Factor: Monitor or instrument
- Applications: Memory drive disc or head
from Nikon Metrology
The NWL200 series is the first lineup of wafer loaders for inspection microscopes capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection of next-generation semiconductors. Improved wafer-sensing functions... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Floor
- Form Factor: ProbingSystem; Wafer Loading System
- Applications: Wafer
from WDI Wise Device Inc.
WDI's Laser Auto-Focus ATF6 sensor is an active optical device (incorporating a class II semiconductor laser) designed to provide focusing servo systems with fast feedback signals needed to quickly and accurately focus all types of infinity corrected microscopes. [See More]
- Technology: Optical / Imaging
- Mounting / Loading: In-process, in-situ or system mounted
- Form Factor: Sensor or sensing element
- Applications: Wafer; CVD / PVD; Flat panel display; Photolithography
from Palomar Technologies, Inc
Overview. The SST 1500 is a manually operated wafer aligner capable of aligning wafer sizes to 8-inch (200 mm) diameter. This clean-room compatible aligner includes two CCD cameras mounted on microscope zoom lenses and connected to a split-screen 17-inch LCD monitor. Fiber optic light rings and... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Benchtop
- Form Factor: Wafer Aligner
- Measurements: Wafer Aligning
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Applications: Wafer (optional feature)
from MicroSense, LLC
Benchtop automated thickness measurement system with X-Y stage on air bearing for wafers up to 8 ” round and for square wafers up to 156mmx156mm. Dual white light chromatic coding probe technology with 10nm resolution. Thickness range from 50um to 1mm. Automated calibration. Hiscan option for... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Form Factor: Monitor or instrument
- Applications: Wafer
from Polytec, Inc.
The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mechanical Systems) devices. By fully integrating a microscope with Scanning Laser-Doppler... [See More]
- Technology: Optical / Imaging; Laser Doppler Vibrometry
- Mounting / Loading: Manual loading
- Form Factor: Sensor or sensing element
- Applications: Surface Topography
from WDI Wise Device Inc.
This is the only commercially available microscope guaranteeing transmission of more then 80% for all four YAG laser harmonics: 266, 355, 532, and 1064nm - without compromising the review channel fidelity. The MIC4 microscope is instrumental in laser repair of TFT arrays over the wavelength ranging... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: In-process, in-situ or system mounted (optional feature); Floor (optional feature)
- Form Factor: Monitor or instrument
- Applications: CVD / PVD; Electroplate; Flat panel display; Packaged IC or substrate; Optical components or lenses; Photolithography; PV Cell, Laser Micromachining, Photomask
from SemiProbe
The SemiProbe M4 is the most modular and flexible 100 mm manual probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a manual 100... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Applications: Wafer (optional feature)
from MicroSense, LLC
Automated Wafer Thickness Measurement System. Cassette to cassette or manual loading. Exclusive sensing technology with dual White light chromatic coding probes (10nm resolution). Wafer 4 ” to 12 ” (100 to 300mm). Thickness range: 50um to 3mm. Extended warpage range up to 5mm. Throughput... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Floor
- Form Factor: Monitor or instrument
- Applications: Wafer
from WDI Wise Device Inc.
The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications. [See More]
- Technology: Optical / Imaging
- Mounting / Loading: In-process, in-situ or system mounted
- Form Factor: Monitor or instrument
- Applications: Wafer; CVD / PVD; Flat panel display; Packaged IC or substrate; Optical components or lenses; Photolithography
from SemiProbe
The SemiProbe SA-4 is the most modular and flexible 100 mm semiautomatic probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a... [See More]
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Form Factor: ProbingSystem
- Applications: Wafer (optional feature)