Wafer Probing System Wafer and Thin Film Instrumentation
from Technic, Inc.
Designer for laboratory testing and sampling, Technic ’s portable tabletop wafer plating test cell features all the tools needed to simulate full scale production. Specifications. 16 ” long, 12 ” wide, 14 ” deep. constructed from ½ ” thick natural polypropylene... [See More]
- Form Factor: ProbingSystem
- Applications: Wafer
- Technology: Wafer sorter or prober
from MTI Instruments Inc.
The Proforma 300SA is a benchtop/desktop, semi-automated wafer measurement system for semi-conducting and semi-insulating materials. Based on MTII ’s exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning for thickness, thickness variation, bow,... [See More]
- Form Factor: ProbingSystem; Sensor or sensing element
- Technology: Capacitance or electromagnetic gage
- Mounting / Loading: Manual loading
- Applications: Wafer
from Nikon Metrology
The NWL200 series is the first lineup of wafer loaders for inspection microscopes capable of loading 100 micron thin wafers. Thanks to a new chuck system, the NWL200 series achieves highly reliable loading suitable for inspection of next-generation semiconductors. Improved wafer-sensing functions... [See More]
- Form Factor: ProbingSystem; Wafer Loading System
- Technology: Optical / Imaging
- Mounting / Loading: Floor
- Applications: Wafer
from Imego
MERMAID is a unique measurement instrument for analysis of liquid and thin film properties using magnetoelastic resonance (MER) sensors. Dynamic events such as viscosity change, phase transitions or bio film growth can be analyzed. The MER sensor can measure properties of either a coating on top of... [See More]
- Form Factor: ProbingSystem; Sensor or sensing element
- Technology: Quartz crystal microbalance; Magnetoelastic Resonance Sensors (MER)
- Mounting / Loading: In-process, in-situ or system mounted; Floor
- Applications: CVD / PVD; Polymer or photoresist films; BioFilms
from Hiden Analytical
The ESPion advanced Langmuir probe for rapid, reliable and accurate plasma diagnostics for industry and academia. [See More]
- Form Factor: Controller; ProbingSystem
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS)
- Mounting / Loading: In-process, in-situ or system mounted
- Applications: Etching; Ion/Electron Collection, Ion Flux
from Nanotronics Imaging
The Nanotronics Imaging nSpec ® is an inspection device designed for high resolution microscopy and detection of wafer defects. With particular application in silicon carbide and Galium Nitride epi wafers, the nSpec ® offers fast quantification and qualification of defects with detailed... [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Applications: Wafer
from Hitachi High Technologies America, Inc.
The wafer surface inspection system LS series can detect defects on unpatterned wafers with a mirror-finished surface. Applied technology of laser scattering achieves high sensitivity and high throughput detection of small contaminants and various types of defects on wafer surfaces prior to... [See More]
- Form Factor: ProbingSystem
- Mounting / Loading: Floor
from Cascade Microtech, Inc.
Sub-micron resolution, precise motion control, and 8-inch travel [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Floor
- Applications: Wafer
from SemiProbe
SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Applications: Wafer (optional feature)
from MTI Instruments Inc.
The Proforma 300i wafer thickness gage is a capacitance based, differential measurement system that performs non-contact thickness measurements of semiconducting and semi-insulating wafers. By utilizing MTI Push/Pull technology, the Proforma 300i does not require the wafers to have a consistent... [See More]
- Form Factor: ProbingSystem; Sensor or sensing element
- Technology: Capacitance or electromagnetic gage
- Mounting / Loading: Manual loading
- Applications: Wafer
from SemiProbe
The LA-50 DC is an economical, small footprint 50 mm (2 ”) probe system for R &D centers and Universities with the stability and flexibility you need for your work. It is configured as a complete system and is installed by the customer and operational within an hour out of the crate. [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Applications: Wafer (optional feature)
from SemiProbe
The SemiProbe M4 is the most modular and flexible 100 mm manual probe system available today. It is built using our patented Probe System for Life (PS4L) architecture which provides unsurpassed flexibility and significant capital equipment savings. With the PS4L, customers can purchase a manual 100... [See More]
- Form Factor: ProbingSystem
- Technology: Optical / Imaging
- Mounting / Loading: Manual loading
- Applications: Wafer (optional feature)