from Hiden Analytical
The ESPion advanced Langmuir probe for rapid, reliable and accurate plasma diagnostics for industry and academia. [See More]
- Form Factor: Controller; ProbingSystem
- Technology: Spectrometer (SIMS, XRF, FTIR, DLTS, AAS)
- Mounting / Loading: In-process, in-situ or system mounted
- Applications: Etching; Ion/Electron Collection, Ion Flux
from MTI Instruments Inc.
Using MTII ’s exclusive Push/Pull capacitance probe technology, each PV-1000 module provides up to three pairs of probes for measurement of maximum, minimum and average thickness, as well as total thickness variation (TTV) and wafer bow. For applications requiring additional thickness... [See More]
- Form Factor: Controller; Sensor or sensing element
- Technology: Capacitance or electromagnetic gage
- Mounting / Loading: In-line; Manual loading; Floor
- Applications: Etching
from NanoAndMore USA Corp.
The new NanoAndMore Tuning Fork Sensor Controller is an electronic device to control the self-oscillation of a quartz tuning fork based sensor and to measure its frequency. The new NanoAndMore Tuning Fork Sensor Controller offers our customers the convenience of a ready to use electronic device to... [See More]
- Form Factor: Controller
- Technology: Profilometer or AFM; SPM
- Mounting / Loading: Manual loading
- Applications: Wafer
from ULVAC Technologies, Inc.
High resolution, high speed sampling, long life span [See More]
- Form Factor: Monitor or instrument; Controller
- Technology: Quartz crystal microbalance
- Mounting / Loading: In-process, in-situ or system mounted
- Applications: Wafer; CVD / PVD; Flat panel display; Optical components or lenses
