Magnetometer Wafer and Thin Film Instrumentation

The Polar Kerr System for MRAM utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize the magnetic properties of multi-layer wafers used in the development and manufacturing of perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of... [See More]

• Technology: Magnetometer
• Mounting / Loading: Floor

• Form Factor: Monitor or instrument
• Applications: Wafer